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Steven John Loveless
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Sachse, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic current sensing
Patent number
11,885,834
Issue date
Jan 30, 2024
Texas Instruments Incorporated
Lei Ding
G01 - MEASURING TESTING
Information
Patent Grant
Direct current measurement of 1/f transistor noise
Patent number
11,796,588
Issue date
Oct 24, 2023
Texas Instruments Incorporated
Yuguo Wang
G01 - MEASURING TESTING
Information
Patent Grant
Direct current measurement of 1/f transistor noise
Patent number
11,249,130
Issue date
Feb 15, 2022
Texas Instruments Incorporated
Yuguo Wang
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic biasing to mitigate electrical stress in integrated resistors
Patent number
10,748,818
Issue date
Aug 18, 2020
Texas Instruments Incorporated
Tathagata Chatterjee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitive mismatch measurement
Patent number
10,236,900
Issue date
Mar 19, 2019
Texas Instruments Incorporated
Steven John Loveless
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE
Publication number
20220082608
Publication date
Mar 17, 2022
TEXAS INSTRUMENTS INCORPORATED
Yuguo WANG
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC CURRENT SENSING
Publication number
20220065900
Publication date
Mar 3, 2022
TEXAS INSTRUMENTS INCORPORATED
LEI DING
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC BIASING TO MITIGATE ELECTRICAL STRESS IN INTEGRATED RESISTORS
Publication number
20200203230
Publication date
Jun 25, 2020
TEXAS INSTRUMENTS INCORPORATED
Tathagata Chatterjee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE
Publication number
20190204375
Publication date
Jul 4, 2019
TEXAS INSTRUMENTS INCORPORATED
Yuguo WANG
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE MISMATCH MEASUREMENT
Publication number
20190181874
Publication date
Jun 13, 2019
TEXAS INSTRUMENTS INCORPORATED
Steven John LOVELESS
G01 - MEASURING TESTING