Steven KASAPI

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for modulation mapping
- Patent number 9,915,700
- Issue date Mar 13, 2018
- FEI EFA, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 9,239,357
- Issue date Jan 19, 2016
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 8,686,748
- Issue date Apr 1, 2014
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 7,990,167
- Issue date Aug 2, 2011
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for modulation mapping
- Patent number 7,733,100
- Issue date Jun 8, 2010
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for voltage noise and jitter measurement using ti...
- Patent number 7,679,358
- Issue date Mar 16, 2010
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for probing integrated circuits using laser il...
- Patent number 7,616,312
- Issue date Nov 10, 2009
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring characteristics of dynamic elect...
- Patent number 7,478,345
- Issue date Jan 13, 2009
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring high-bandwidth electrical signal...
- Patent number 7,450,245
- Issue date Nov 11, 2008
- DCG Systems, Inc.
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,439,730
- Issue date Oct 21, 2008
- DCG Systems, Inc.
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,323,862
- Issue date Jan 29, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Knife edge tracking system and method
- Patent number 7,227,580
- Issue date Jun 5, 2007
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting single photon detector
- Patent number 7,049,593
- Issue date May 23, 2006
- Credence Systems Corporation
- Roman Sobolewski
- G01 - MEASURING TESTING
Information Patent Grant
Optical coupling for testing integrated circuits
- Patent number 7,042,563
- Issue date May 9, 2006
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,038,442
- Issue date May 2, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining voltage using optical observation
- Patent number 7,012,537
- Issue date Mar 14, 2006
- Credence Systems Corporation
- Gary Leonard Woods
- G01 - MEASURING TESTING
Information Patent Grant
Optical coupling for testing integrated circuits
- Patent number 6,985,219
- Issue date Jan 10, 2006
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring characteristics of dynamic elect...
- Patent number 6,976,234
- Issue date Dec 13, 2005
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
Universal diagnostic platform for specimen analysis
- Patent number 6,961,672
- Issue date Nov 1, 2005
- Credence Systems Coporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibration of testing equipment using device...
- Patent number 6,956,365
- Issue date Oct 18, 2005
- Credence Systems Corporation
- Israel Niv
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,891,363
- Issue date May 10, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for dynamic diagnostic testing of integrated c...
- Patent number 6,859,031
- Issue date Feb 22, 2005
- Credence Systems Corporation
- Nader Pakdaman
- G01 - MEASURING TESTING
Information Patent Grant
Spray cooling and transparent cooling plate thermal management system
- Patent number 6,836,131
- Issue date Dec 28, 2004
- Credence Systems Corp.
- Tahir Cader
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting single photon detector
- Patent number 6,812,464
- Issue date Nov 2, 2004
- Credence Systems Corporation
- Roman Sobolewski
- G01 - MEASURING TESTING
Information Patent Grant
Differential pulsed laser beam probing of integrated circuits
- Patent number 6,252,222
- Issue date Jun 26, 2001
- Schlumberger Technologies, Inc.
- Steven A. Kasapi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MODULATION MAPPING
- Publication number 20160131703
- Publication date May 12, 2016
- DCG SYSTEMS, INC.
- Steven KASAPI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MODULATION MAPPING
- Publication number 20130113510
- Publication date May 9, 2013
- DCG SYSTEMS, INC.
- Steven KASAPI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MODULATION MAPPING
- Publication number 20110199110
- Publication date Aug 18, 2011
- DCG SYSTEMS, INC.
- Steven KASAPI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE NOISE AND JITTER MEASUREMENT USING TI...
- Publication number 20070236206
- Publication date Oct 11, 2007
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
System and method for modulation mapping
- Publication number 20070046301
- Publication date Mar 1, 2007
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070002329
- Publication date Jan 4, 2007
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring high-bandwidth electrical signal...
- Publication number 20070002328
- Publication date Jan 4, 2007
- Credence Systems Corporation
- Gary Woods
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS
- Publication number 20060181268
- Publication date Aug 17, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20060108997
- Publication date May 25, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for dynamic diagnostic testing of integrated c...
- Publication number 20060103378
- Publication date May 18, 2006
- Nader Pakdaman
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring characteristics of dynamic elect...
- Publication number 20060031036
- Publication date Feb 9, 2006
- Credence Systems Corporation
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining voltage using optical observation
- Publication number 20050174248
- Publication date Aug 11, 2005
- Gary Leonard Woods
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050146321
- Publication date Jul 7, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Optical coupling for testing integrated circuits
- Publication number 20050128471
- Publication date Jun 16, 2005
- Credence Systems Corporation
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Knife edge tracking system and method
- Publication number 20050110893
- Publication date May 26, 2005
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Superconducting single photon detector
- Publication number 20050051726
- Publication date Mar 10, 2005
- Credence Systems Corporation
- Roman Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
Time resolved emission spectral analysis system
- Publication number 20050002028
- Publication date Jan 6, 2005
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
System and method for calibration of testing equipment using device...
- Publication number 20040201375
- Publication date Oct 14, 2004
- Israel Niv
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring characteristics of dynamic elect...
- Publication number 20040139406
- Publication date Jul 15, 2004
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040041575
- Publication date Mar 4, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Spray cooling and transparent cooling plate thermal management system
- Publication number 20040032275
- Publication date Feb 19, 2004
- Tahir Cader
- G01 - MEASURING TESTING
Information Patent Application
Universal diagnostic platform for specimen analysis
- Publication number 20030220760
- Publication date Nov 27, 2003
- Steven Kasapi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for dynamic diagnostic testing of integrated c...
- Publication number 20030146761
- Publication date Aug 7, 2003
- Nader Pakdaman
- G01 - MEASURING TESTING
Information Patent Application
Optical coupling for testing integrated circuits
- Publication number 20020113958
- Publication date Aug 22, 2002
- Kenneth R. Wilsher
- G01 - MEASURING TESTING

Steven KASAPI

Person

Patents Grantslast 30 patents

System and method for modulation mapping

System and method for modulation mapping

System and method for modulation mapping

System and method for modulation mapping

System and method for modulation mapping

System and method for voltage noise and jitter measurement using ti...

Apparatus and method for probing integrated circuits using laser il...

Apparatus and method for measuring characteristics of dynamic elect...

Method and apparatus for measuring high-bandwidth electrical signal...

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Knife edge tracking system and method

Superconducting single photon detector

Optical coupling for testing integrated circuits

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for determining voltage using optical observation

Optical coupling for testing integrated circuits

Apparatus and method for measuring characteristics of dynamic elect...

Universal diagnostic platform for specimen analysis

System and method for calibration of testing equipment using device...

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for dynamic diagnostic testing of integrated c...

Spray cooling and transparent cooling plate thermal management system

Superconducting single photon detector

Differential pulsed laser beam probing of integrated circuits

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MODULATION MAPPING

SYSTEM AND METHOD FOR MODULATION MAPPING

SYSTEM AND METHOD FOR MODULATION MAPPING

SYSTEM AND METHOD FOR VOLTAGE NOISE AND JITTER MEASUREMENT USING TI...

System and method for modulation mapping

Laser probing system for integrated circuits

Method and apparatus for measuring high-bandwidth electrical signal...

APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for dynamic diagnostic testing of integrated c...

Apparatus and method for measuring characteristics of dynamic elect...

Apparatus and method for determining voltage using optical observation

Apparatus and method for detecting photon emissions from transistors

Optical coupling for testing integrated circuits

Knife edge tracking system and method

Superconducting single photon detector

Time resolved emission spectral analysis system

System and method for calibration of testing equipment using device...

Apparatus and method for measuring characteristics of dynamic elect...

Apparatus and method for detecting photon emissions from transistors

Spray cooling and transparent cooling plate thermal management system

Universal diagnostic platform for specimen analysis

Apparatus and method for dynamic diagnostic testing of integrated c...

Optical coupling for testing integrated circuits