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Steven Kim
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Phoenix, AZ, US
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last 30 patents
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Patent Grant
Method and system for improving characteristic peak signals in anal...
Patent number
9,406,496
Issue date
Aug 2, 2016
Universitat de Barcelona
Sonia Estrade Albiol
G01 - MEASURING TESTING
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Patent Grant
System and process for measuring strain in materials at high spatia...
Patent number
9,274,070
Issue date
Mar 1, 2016
APPFIVE, LLC
Jon Karl Weiss
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND PROCESS FOR MEASURING STRAIN IN MATERIALS AT HIGH SPATIA...
Publication number
20150076346
Publication date
Mar 19, 2015
Jon Karl Weiss
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...
Publication number
20130240728
Publication date
Sep 19, 2013
Universitat De Barcelona
Sonia Estrade Albiol
G01 - MEASURING TESTING