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Steven L. Williamson
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Henrietta, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
System for determining at least one property of a sheet dielectric...
Patent number
10,215,696
Issue date
Feb 26, 2019
Picometrix, LLC
David Zimdars
G01 - MEASURING TESTING
Information
Patent Grant
System for transmitting and receiving electromagnetic radiation
Patent number
9,998,236
Issue date
Jun 12, 2018
Picometrix, LLC
Timothy Strong
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Photoconductive device
Patent number
9,136,419
Issue date
Sep 15, 2015
Picometrix, LLC
Robert N. Sacks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method to measure the transit time position(s) of pulses...
Patent number
8,457,915
Issue date
Jun 4, 2013
Picometrix, LLC
Jeffrey S. White
G01 - MEASURING TESTING
Information
Patent Grant
Optical delay
Patent number
8,390,910
Issue date
Mar 5, 2013
Picometrix, LLC
David A. Zimdars
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz imaging system for examining articles
Patent number
7,449,695
Issue date
Nov 11, 2008
Picometrix
David A. Zimdars
G01 - MEASURING TESTING
Information
Patent Grant
Precision fiber attachment
Patent number
7,263,266
Issue date
Aug 28, 2007
Picometrix, LLC
Steven L. Williamson
G02 - OPTICS
Information
Patent Grant
Focusing fiber optic
Patent number
7,039,275
Issue date
May 2, 2006
Picometrix, Inc.
Steven L. Williamson
G02 - OPTICS
Information
Patent Grant
Amplified photoconductive gate
Patent number
6,936,821
Issue date
Aug 30, 2005
Picometrix, Inc.
Steven L. Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for monitoring changes in state of matter with te...
Patent number
6,849,852
Issue date
Feb 1, 2005
Picometrix, Inc.
Steven L. Williamson
G01 - MEASURING TESTING
Information
Patent Grant
Compact fiber pigtailed terahertz modules
Patent number
6,816,647
Issue date
Nov 9, 2004
Picometrix, Inc.
James V. Rudd
G01 - MEASURING TESTING
Information
Patent Grant
Highly-doped P-type contact for high-speed, front-side illuminated...
Patent number
6,262,465
Issue date
Jul 17, 2001
Picometrix, Inc.
Steven L. Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-speed, high-impedance external photoconductive-type sampling p...
Patent number
5,317,256
Issue date
May 31, 1994
University of Michigan
Steven L. Williamson
G01 - MEASURING TESTING
Information
Patent Grant
Electro-electron oscilloscope
Patent number
5,053,696
Issue date
Oct 1, 1991
The University of Rochester
Steven L. Williamson
G02 - OPTICS
Information
Patent Grant
Electro-optic signal measurement
Patent number
5,006,789
Issue date
Apr 9, 1991
The University of Rochester
Steven Williamson
G01 - MEASURING TESTING
Information
Patent Grant
Ultrafast optical modulator
Patent number
4,928,076
Issue date
May 22, 1990
The University of Rochester
Gerard A. Mourou
G02 - OPTICS
Information
Patent Grant
Electro-optic signal measurement
Patent number
4,928,058
Issue date
May 22, 1990
The University of Rochester
Steven Williamson
G01 - MEASURING TESTING
Information
Patent Grant
System for electrical signal sampling with ultrashort optical pulses
Patent number
4,910,454
Issue date
Mar 20, 1990
The University of Rochester
Steven Williamson
G01 - MEASURING TESTING
Information
Patent Grant
CW pumper CW pumped variable repetition rate regenerative laser amp...
Patent number
4,896,119
Issue date
Jan 23, 1990
The University of Rochester
Steven L. Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electro-optic signal measurement
Patent number
4,873,485
Issue date
Oct 10, 1989
The University of Rochester
Steven L. Williamson
G01 - MEASURING TESTING
Information
Patent Grant
Electron-optical wide band signal measurement system
Patent number
4,434,399
Issue date
Feb 28, 1984
The University of Rochester
Gerard Mourou
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectron switching in semiconductors in the picosecond time do...
Patent number
4,431,914
Issue date
Feb 14, 1984
The University of Rochester
Gerard Mourou
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM FOR DETERMINING AT LEAST ONE PROPERTY OF A SHEET DIELECTRIC...
Publication number
20170023469
Publication date
Jan 26, 2017
PICOMETRIX, LLC
David Zimdars
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TRANSMITTING AND RECEIVING ELECTROMAGNETIC RADIATION
Publication number
20160315716
Publication date
Oct 27, 2016
PICOMETRIX, LLC
Timothy Strong
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND METHOD TO MEASURE THE TRANSIT TIME POSITION(S) OF PULSES...
Publication number
20100280779
Publication date
Nov 4, 2010
Jeffrey S. White
G01 - MEASURING TESTING
Information
Patent Application
DISPERSION AND NONLINEAR COMPENSATOR FOR OPTICAL DELIVERY FIBER
Publication number
20090190933
Publication date
Jul 30, 2009
Greg Fichter
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Optical Delay
Publication number
20080259428
Publication date
Oct 23, 2008
David A. Zimdars
G02 - OPTICS
Information
Patent Application
Photoconductive Device
Publication number
20080093625
Publication date
Apr 24, 2008
Robert N. Sacks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Terahertz imaging system for examining articles
Publication number
20070235658
Publication date
Oct 11, 2007
David A. Zimdars
G01 - MEASURING TESTING
Information
Patent Application
Precision fiber attachment
Publication number
20060056788
Publication date
Mar 16, 2006
Steven L. Williamson
G02 - OPTICS
Information
Patent Application
System and method for monitoring changes in state of matter with te...
Publication number
20030226969
Publication date
Dec 11, 2003
Steven L. Williamson
G01 - MEASURING TESTING
Information
Patent Application
Amplified photoconductive gate
Publication number
20030127673
Publication date
Jul 10, 2003
Picometrix, Inc.
Steven L. Williamson
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
focusing fiber optic
Publication number
20030095746
Publication date
May 22, 2003
Steven L. Williamson
G02 - OPTICS