Steven Lowell Haehn

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Fort Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting defects in integrated circuit di...
- Patent number 7,617,427
- Issue date Nov 10, 2009
- LSI Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING
Information Patent Grant
Secure, stable on chip silicon identification
- Patent number 7,603,637
- Issue date Oct 13, 2009
- LSI Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING
Information Patent Grant
System for yield enhancement in programmable logic
- Patent number 6,825,688
- Issue date Nov 30, 2004
- LSI Logic Corporation
- Steven L. Haehn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining a subthreshold leakage test limit...
- Patent number 6,623,992
- Issue date Sep 23, 2003
- LSI Logic Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING
Information Patent Grant
Backside failure analysis capable integrated circuit packaging
- Patent number 6,261,870
- Issue date Jul 17, 2001
- LSI Logic Corporation
- Steven L. Haehn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing semiconductor devices for data retention
- Patent number 6,091,652
- Issue date Jul 18, 2000
- LSI Logic Corporation
- Steven L. Haehn
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Copper Wire Bonding Apparatus Using A Purge Gas to Enhance Ball Bon...
- Publication number 20150243534
- Publication date Aug 27, 2015
- LSI Corporation
- John W. Osenbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Secure, Stable On Chip Silicon Identification
- Publication number 20080082875
- Publication date Apr 3, 2008
- LSI Logic Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects in integrated circuit di...
- Publication number 20070157056
- Publication date Jul 5, 2007
- LSI Logic Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING
Information Patent Application
Low cost test option using redundant logic
- Publication number 20050147048
- Publication date Jul 7, 2005
- Steven L. Haehn
- G01 - MEASURING TESTING