Houston, TX, US
Information
Patent Grant
Baker Hughes, a GE company, LLC
Quming Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Baker Hughes Incorporated
Feyzi Inanc
G01 - MEASURING TESTING
Information
Patent Grant
Baker Hughes Incorporated
Steven M. Bliven
G01 - MEASURING TESTING
Information
Patent Grant
Baker Hughes Incorporated
Maxim Vasilyev
G01 - MEASURING TESTING
Information
Patent Grant
Baker Hughes Incorporated
Steven M. Bliven
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Baker Hughes Incorporated
Constantyn Chalitsios
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Baker Hughes Incorporated
Steven Bliven
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Baker Hughes Incorporated
W. Allen Gilchrist
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
BAKER HUGHES INCORPORATED
QUMING ZHOU
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Maxim VASILYEV
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Feyzi Inanc
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Steven M. Bliven
G01 - MEASURING TESTING
Information
Patent Application
Maxim VASILYEV
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
W. Allen Gilchrist
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Steven M. Bliven
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Steven Bliven
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Constantyn Chalitsios
G01 - MEASURING TESTING
Information
Patent Application
BAKER HUGHES INCORPORATED
Steven M. Bliven
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
