Steven M. Blumenau

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Royalston, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Capacitive open-circuit and short-circuit tests of component connec...
- Patent number 5,786,697
- Issue date Jul 28, 1998
- Genrad, Inc.
- Moses Khazam
- G01 - MEASURING TESTING
Information Patent Grant
System and method of programming a multistation testing system
- Patent number 5,615,219
- Issue date Mar 25, 1997
- GenRad, Inc.
- Paul L. Keating
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Connector for automatic test equipment
- Patent number 5,602,490
- Issue date Feb 11, 1997
- GenRad, Inc.
- Steven M. Blumenau
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive alignment probe fixture for circuit board tester
- Patent number 5,506,510
- Issue date Apr 9, 1996
- GenRad, Inc.
- Steven M. Blumenau
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-test fixture that includes shorted-together probes
- Patent number 5,457,380
- Issue date Oct 10, 1995
- GenRad, Inc.
- Steven M. Blumenau
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive open-circuit test employing threshold determination
- Patent number 5,391,993
- Issue date Feb 21, 1995
- GenRad, Inc.
- Moses Khazam
- G01 - MEASURING TESTING