Steven M. Douskey

Person

Rochester, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Diagnostic enhancement for multiple instances of identical structures
- Patent number 11,378,623
- Issue date Jul 5, 2022
- International Business Machines Corporation
- Steven Michael Douskey
- G11 - INFORMATION STORAGE
Information Patent Grant
Operating pulsed latches on a variable power supply
- Patent number 11,112,854
- Issue date Sep 7, 2021
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamically power noise adaptive automatic test pattern generation
- Patent number 10,816,599
- Issue date Oct 27, 2020
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Operating pulsed latches on a variable power supply
- Patent number 10,386,912
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Minimization of over-masking in an on product multiple input signat...
- Patent number 10,379,159
- Issue date Aug 13, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing enhanced diagnostics with intelligent pattern combinat...
- Patent number 10,372,853
- Issue date Aug 6, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Removal of over-masking in an on product multiple input signature r...
- Patent number 10,371,749
- Issue date Aug 6, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Minimization of over-masking in an on product multiple input signat...
- Patent number 10,371,750
- Issue date Aug 6, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Implementing decreased scan data interdependence for compressed pat...
- Patent number 10,359,471
- Issue date Jul 23, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing over-masking removal in an on product multiple input s...
- Patent number 10,345,380
- Issue date Jul 9, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing register array (RA) repair using LBIST
- Patent number 10,234,507
- Issue date Mar 19, 2019
- International Business Machines Corporation
- Steven M. Douskey
- G11 - INFORMATION STORAGE
Information Patent Grant
Portion isolation architecture for chip isolation test
- Patent number 10,067,183
- Issue date Sep 4, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing prioritized compressed failure defects for efficient s...
- Patent number 10,060,978
- Issue date Aug 28, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Adjusting latency in a scan cell
- Patent number 10,060,971
- Issue date Aug 28, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosing failure locations of an integrated circuit with logic bu...
- Patent number 10,024,914
- Issue date Jul 17, 2018
- GLOBALFOUNDRIES Inc.
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing decreased scan data interdependence for compressed pat...
- Patent number 10,024,917
- Issue date Jul 17, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Adjusting latency in a scan cell
- Patent number 10,001,523
- Issue date Jun 19, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing decreased scan data interdependence in on product mult...
- Patent number 9,964,591
- Issue date May 8, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Collecting diagnostic data from chips
- Patent number 9,746,516
- Issue date Aug 29, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain processing in a partially functional chip
- Patent number 9,726,723
- Issue date Aug 8, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan chain processing in a partially functional chip
- Patent number 9,575,120
- Issue date Feb 21, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing redundancy repair using boundary scans
- Patent number 9,568,549
- Issue date Feb 14, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Partitioned scan chain diagnostics using multiple bypass structures...
- Patent number 9,557,383
- Issue date Jan 31, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Inserting bypass structures at tap points to reduce latch dependenc...
- Patent number 9,551,747
- Issue date Jan 24, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Inserting bypass structures at tap points to reduce latch dependenc...
- Patent number 9,547,039
- Issue date Jan 17, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Partitioned scan chain diagnostics using multiple bypass structures...
- Patent number 9,529,046
- Issue date Dec 27, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing enhanced scan chain diagnostics via bypass multiplexin...
- Patent number 9,429,622
- Issue date Aug 30, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Implementing enhanced scan chain diagnostics via bypass multiplexin...
- Patent number 9,429,621
- Issue date Aug 30, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient hierarchical chip testing and di...
- Patent number 9,404,969
- Issue date Aug 2, 2016
- Cadence Design Systems, Inc.
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Grant
Shared channel masks in on-product test compression system
- Patent number 9,378,318
- Issue date Jun 28, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES
- Publication number 20220178996
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Steven Michael DOUSKEY
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMICALLY POWER NOISE ADAPTIVE AUTOMATIC TEST PATTERN GENERATION
- Publication number 20200225283
- Publication date Jul 16, 2020
- International Business Machines Corporation
- Steven M. DOUSKEY
- G01 - MEASURING TESTING
Information Patent Application
OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY
- Publication number 20190286221
- Publication date Sep 19, 2019
- International Business Machines Corporation
- STEVEN M. DOUSKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPLEMENTING ENHANCED DIAGNOSTICS WITH INTELLIGENT PATTERN COMBINAT...
- Publication number 20180267102
- Publication date Sep 20, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING INTEGRATED CIRCUIT YIELD ENHANCEMENT THROUGH ARRAY FAU...
- Publication number 20180259576
- Publication date Sep 13, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY
- Publication number 20180196497
- Publication date Jul 12, 2018
- International Business Machines Corporation
- STEVEN M. DOUSKEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTING LATENCY IN A SCAN CELL
- Publication number 20180052198
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Steven M. DOUSKEY
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING LATENCY IN A SCAN CELL
- Publication number 20180052199
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Steven M. DOUSKEY
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING REGISTER ARRAY (RA) REPAIR USING LBIST
- Publication number 20180024189
- Publication date Jan 25, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSING FAILURE LOCATIONS OF AN INTEGRATED CIRCUIT WITH LOGIC BU...
- Publication number 20180003768
- Publication date Jan 4, 2018
- GLOBALFOUNDRIES INC.
- STEVEN M. DOUSKEY
- G01 - MEASURING TESTING
Information Patent Application
PORTION ISOLATION ARCHITECTURE FOR CHIP ISOLATION TEST
- Publication number 20170363683
- Publication date Dec 21, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING PRIORITIZED COMPRESSED FAILURE DEFECTS FOR EFFICIENT S...
- Publication number 20170363685
- Publication date Dec 21, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING DECREASED SCAN DATA INTERDEPENDENCE FOR COMPRESSED PAT...
- Publication number 20170356959
- Publication date Dec 14, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING DECREASED SCAN DATA INTERDEPENDENCE IN ON PRODUCT MULT...
- Publication number 20170299654
- Publication date Oct 19, 2017
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
COLLECTING DIAGNOSTIC DATA FROM CHIPS
- Publication number 20160238656
- Publication date Aug 18, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING ENHANCED SCAN CHAIN DIAGNOSTICS VIA BYPASS MULTIPLEXIN...
- Publication number 20160216323
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING ENHANCED SCAN CHAIN DIAGNOSTICS VIA BYPASS MULTIPLEXIN...
- Publication number 20160216324
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
INSERTING BYPASS STRUCTURES AT TAP POINTS TO REDUCE LATCH DEPENDENC...
- Publication number 20160169972
- Publication date Jun 16, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
PARTITIONED SCAN CHAIN DIAGNOSTICS USING MULTIPLE BYPASS STRUCTURES...
- Publication number 20160169969
- Publication date Jun 16, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
INSERTING BYPASS STRUCTURES AT TAP POINTS TO REDUCE LATCH DEPENDENC...
- Publication number 20160169967
- Publication date Jun 16, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
PARTITIONED SCAN CHAIN DIAGNOSTICS USING MULTIPLE BYPASS STRUCTURES...
- Publication number 20160169968
- Publication date Jun 16, 2016
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN PROCESSING IN A PARTIALLY FUNCTIONAL CHIP
- Publication number 20150346280
- Publication date Dec 3, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
MANAGING REDUNDANCY REPAIR USING BOUNDARY SCANS
- Publication number 20150346279
- Publication date Dec 3, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
SHARED CHANNEL MASKS IN ON-PRODUCT TEST COMPRESSION SYSTEM
- Publication number 20150254390
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIERARCHAL TEST BLOCK TEST PATTERN REDUCTION IN ON-PRODUCT TEST COM...
- Publication number 20150253382
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
SHARED CHANNEL MASKS IN ON-PRODUCT TEST COMPRESSION SYSTEM
- Publication number 20150254387
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIERARCHAL TEST BLOCK TEST PATTERN REDUCTION IN ON-PRODUCT TEST COM...
- Publication number 20150253383
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
COLLECTING DIAGNOSTIC DATA FROM CHIPS
- Publication number 20150168491
- Publication date Jun 18, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
MANAGING CHIP TESTING DATA
- Publication number 20150168490
- Publication date Jun 18, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING MISR COMPRESSION METHODS FOR TEST TIME REDUCTION
- Publication number 20150113348
- Publication date Apr 23, 2015
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING

Steven M. Douskey

Person

Patents Grantslast 30 patents

Diagnostic enhancement for multiple instances of identical structures

Operating pulsed latches on a variable power supply

Dynamically power noise adaptive automatic test pattern generation

Operating pulsed latches on a variable power supply

Minimization of over-masking in an on product multiple input signat...

Implementing enhanced diagnostics with intelligent pattern combinat...

Removal of over-masking in an on product multiple input signature r...

Minimization of over-masking in an on product multiple input signat...

Implementing decreased scan data interdependence for compressed pat...

Implementing over-masking removal in an on product multiple input s...

Implementing register array (RA) repair using LBIST

Portion isolation architecture for chip isolation test

Implementing prioritized compressed failure defects for efficient s...

Adjusting latency in a scan cell

Diagnosing failure locations of an integrated circuit with logic bu...

Implementing decreased scan data interdependence for compressed pat...

Adjusting latency in a scan cell

Implementing decreased scan data interdependence in on product mult...

Collecting diagnostic data from chips

Scan chain processing in a partially functional chip

Scan chain processing in a partially functional chip

Managing redundancy repair using boundary scans

Partitioned scan chain diagnostics using multiple bypass structures...

Inserting bypass structures at tap points to reduce latch dependenc...

Inserting bypass structures at tap points to reduce latch dependenc...

Partitioned scan chain diagnostics using multiple bypass structures...

Implementing enhanced scan chain diagnostics via bypass multiplexin...

Implementing enhanced scan chain diagnostics via bypass multiplexin...

Method and apparatus for efficient hierarchical chip testing and di...

Shared channel masks in on-product test compression system

Patents Applicationslast 30 patents

DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES

DYNAMICALLY POWER NOISE ADAPTIVE AUTOMATIC TEST PATTERN GENERATION

OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY

IMPLEMENTING ENHANCED DIAGNOSTICS WITH INTELLIGENT PATTERN COMBINAT...

IMPLEMENTING INTEGRATED CIRCUIT YIELD ENHANCEMENT THROUGH ARRAY FAU...

OPERATING PULSED LATCHES ON A VARIABLE POWER SUPPLY

ADJUSTING LATENCY IN A SCAN CELL

ADJUSTING LATENCY IN A SCAN CELL

IMPLEMENTING REGISTER ARRAY (RA) REPAIR USING LBIST

DIAGNOSING FAILURE LOCATIONS OF AN INTEGRATED CIRCUIT WITH LOGIC BU...

PORTION ISOLATION ARCHITECTURE FOR CHIP ISOLATION TEST

IMPLEMENTING PRIORITIZED COMPRESSED FAILURE DEFECTS FOR EFFICIENT S...

IMPLEMENTING DECREASED SCAN DATA INTERDEPENDENCE FOR COMPRESSED PAT...

IMPLEMENTING DECREASED SCAN DATA INTERDEPENDENCE IN ON PRODUCT MULT...

COLLECTING DIAGNOSTIC DATA FROM CHIPS

IMPLEMENTING ENHANCED SCAN CHAIN DIAGNOSTICS VIA BYPASS MULTIPLEXIN...

IMPLEMENTING ENHANCED SCAN CHAIN DIAGNOSTICS VIA BYPASS MULTIPLEXIN...

INSERTING BYPASS STRUCTURES AT TAP POINTS TO REDUCE LATCH DEPENDENC...

PARTITIONED SCAN CHAIN DIAGNOSTICS USING MULTIPLE BYPASS STRUCTURES...

INSERTING BYPASS STRUCTURES AT TAP POINTS TO REDUCE LATCH DEPENDENC...

PARTITIONED SCAN CHAIN DIAGNOSTICS USING MULTIPLE BYPASS STRUCTURES...

SCAN CHAIN PROCESSING IN A PARTIALLY FUNCTIONAL CHIP

MANAGING REDUNDANCY REPAIR USING BOUNDARY SCANS

SHARED CHANNEL MASKS IN ON-PRODUCT TEST COMPRESSION SYSTEM

HIERARCHAL TEST BLOCK TEST PATTERN REDUCTION IN ON-PRODUCT TEST COM...

SHARED CHANNEL MASKS IN ON-PRODUCT TEST COMPRESSION SYSTEM

HIERARCHAL TEST BLOCK TEST PATTERN REDUCTION IN ON-PRODUCT TEST COM...

COLLECTING DIAGNOSTIC DATA FROM CHIPS

MANAGING CHIP TESTING DATA

IMPLEMENTING MISR COMPRESSION METHODS FOR TEST TIME REDUCTION