Steven M. Kientz

Person

Broomfield, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Threshold voltage bin calibration at memory device power up
- Patent number 12,210,759
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic temperature compensation in a memory component
- Patent number 12,141,443
- Issue date Nov 12, 2024
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive temperature compensation for a memory device
- Patent number 12,131,795
- Issue date Oct 29, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Program continuation strategies after memory device power loss
- Patent number 12,119,068
- Issue date Oct 15, 2024
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Grant
Two-stage voltage calibration upon power-up of memory device
- Patent number 12,073,866
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining read voltage offset in memory devices
- Patent number 12,057,190
- Issue date Aug 6, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Grant
Two-sided page scans with calibration feedback
- Patent number 12,040,025
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Christopher M. Smitchger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charge loss mitigation throughout memory device lifecycle by proact...
- Patent number 11,977,774
- Issue date May 7, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tracking and refreshing state metrics in memory sub-systems
- Patent number 11,955,194
- Issue date Apr 9, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Threshold voltage bin calibration at memory device power up
- Patent number 11,922,041
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim value loading management in a memory sub-system
- Patent number 11,914,890
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die family management on a memory device using block family error a...
- Patent number 11,886,712
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block family-based error avoidance for memory devices
- Patent number 11,886,726
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of state metrics of memory sub-systems following powe...
- Patent number 11,862,274
- Issue date Jan 2, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Combining sets of memory blocks in a memory device
- Patent number 11,853,556
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature-compensated time estimate for a block to reach a unifor...
- Patent number 11,854,649
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage bin boundary calibration at memory device power up
- Patent number 11,842,772
- Issue date Dec 12, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Open block family duration limited by temperature variation
- Patent number 11,842,061
- Issue date Dec 12, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement of representative charge loss in a block to determine c...
- Patent number 11,797,205
- Issue date Oct 24, 2023
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage offset bin selection based on die family in memor...
- Patent number 11,791,004
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Error avoidance based on voltage distribution parameters of blocks
- Patent number 11,735,254
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Shane Nowell
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system with dynamic calibration using a variable adjustment...
- Patent number 11,733,929
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system with dynamic calibration using a trim management mech...
- Patent number 11,721,399
- Issue date Aug 8, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart sampling for block family scan
- Patent number 11,721,409
- Issue date Aug 8, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Write data for bin resynchronization after power loss
- Patent number 11,709,775
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error avoidance based on voltage distribution parameters
- Patent number 11,705,193
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Shane Nowell
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge loss scan operation management in memory devices
- Patent number 11,704,217
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error-handling flows in memory devices based on bins
- Patent number 11,693,745
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple open block families supporting multiple cursors of a memor...
- Patent number 11,675,509
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Associating multiple cursors with block family of memory device
- Patent number 11,675,511
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT
- Publication number 20250044948
- Publication date Feb 6, 2025
- Lodestar Licensing Group, LLC
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE
- Publication number 20250029639
- Publication date Jan 23, 2025
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM CONTINUATION STRATEGIES AFTER MEMORY DEVICE POWER LOSS
- Publication number 20250006281
- Publication date Jan 2, 2025
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE
- Publication number 20240386936
- Publication date Nov 21, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGE LOSS TRACKING THROUGH TARGETED BIT COUNT
- Publication number 20240363188
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES
- Publication number 20240347084
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS WITH MEMORY CELL CALIBRATION MECHANISM AND METHODS FOR OP...
- Publication number 20240329867
- Publication date Oct 3, 2024
- Micron Technology, Inc.
- Yee Yang Tay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLOW-CHARGE-LOSS TRACKING USING FEEDBACK-CONTROL LOOP
- Publication number 20240282390
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Lei Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
SLOW CHARGE LOSS MONITOR FOR POWER UP PERFORMANCE BOOSTING
- Publication number 20240274202
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Nicola Ciocchini
- G11 - INFORMATION STORAGE
Information Patent Application
TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS
- Publication number 20240265989
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGE LOSS MITIGATION THROUGHOUT MEMORY DEVICE LIFECYCLE BY PROACT...
- Publication number 20240241672
- Publication date Jul 18, 2024
- MICRON TECHNOLGY, INC.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY READ VOLTAGE THRESHOLD TRACKING BASED ON MEMORY DEVICE-ORIGI...
- Publication number 20240161836
- Publication date May 16, 2024
- Micron Technology, Inc.
- Shantilal Rayshi Doru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THRESHOLD VOLTAGE BIN CALIBRATION AT MEMORY DEVICE POWER UP
- Publication number 20240143214
- Publication date May 2, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR A...
- Publication number 20240118807
- Publication date Apr 11, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK FAMILY-BASED ERROR AVOIDANCE FOR MEMORY DEVICES
- Publication number 20240111445
- Publication date Apr 4, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE-COMPENSATED TIME ESTIMATE FOR A BLOCK TO REACH A UNIFOR...
- Publication number 20240079035
- Publication date Mar 7, 2024
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES
- Publication number 20240071440
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Application
OPEN BLOCK FAMILY DURATION LIMITED BY TEMPERATURE VARIATION
- Publication number 20240045605
- Publication date Feb 8, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE C...
- Publication number 20240004567
- Publication date Jan 4, 2024
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE CALIBRATION FOR THRESHOLD VOLTAGE OFFSET BINS
- Publication number 20230395170
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE
- Publication number 20230395099
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR A...
- Publication number 20230393745
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-SIDED PAGE SCANS WITH CALIBRATION FEEDBACK
- Publication number 20230268009
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Christopher M. Smitchger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAM CONTINUATION STRATEGIES AFTER MEMORY DEVICE POWER LOSS
- Publication number 20230268014
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Gary F. Besinga
- G11 - INFORMATION STORAGE
Information Patent Application
THRESHOLD VOLTAGE BIN CALIBRATION AT MEMORY DEVICE POWER UP
- Publication number 20230266904
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE-COMPENSATED TIME ESTIMATE FOR A BLOCK TO REACH A UNIFOR...
- Publication number 20230267968
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE
- Publication number 20230267986
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Steven Michael Kientz
- G11 - INFORMATION STORAGE
Information Patent Application
MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE C...
- Publication number 20230266901
- Publication date Aug 24, 2023
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS
- Publication number 20230245708
- Publication date Aug 3, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINATION OF STATE METRICS OF MEMORY SUB-SYSTEMS FOLLOWING POWE...
- Publication number 20230207043
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE

Steven M. Kientz

Person

Patents Grantslast 30 patents

Threshold voltage bin calibration at memory device power up

Dynamic temperature compensation in a memory component

Adaptive temperature compensation for a memory device

Program continuation strategies after memory device power loss

Two-stage voltage calibration upon power-up of memory device

Determining read voltage offset in memory devices

Two-sided page scans with calibration feedback

Charge loss mitigation throughout memory device lifecycle by proact...

Tracking and refreshing state metrics in memory sub-systems

Threshold voltage bin calibration at memory device power up

Trim value loading management in a memory sub-system

Die family management on a memory device using block family error a...

Block family-based error avoidance for memory devices

Determination of state metrics of memory sub-systems following powe...

Combining sets of memory blocks in a memory device

Temperature-compensated time estimate for a block to reach a unifor...

Voltage bin boundary calibration at memory device power up

Open block family duration limited by temperature variation

Measurement of representative charge loss in a block to determine c...

Threshold voltage offset bin selection based on die family in memor...

Error avoidance based on voltage distribution parameters of blocks

Memory system with dynamic calibration using a variable adjustment...

Memory system with dynamic calibration using a trim management mech...

Smart sampling for block family scan

Write data for bin resynchronization after power loss

Error avoidance based on voltage distribution parameters

Charge loss scan operation management in memory devices

Error-handling flows in memory devices based on bins

Multiple open block families supporting multiple cursors of a memor...

Associating multiple cursors with block family of memory device

Patents Applicationslast 30 patents

DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT

ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE

PROGRAM CONTINUATION STRATEGIES AFTER MEMORY DEVICE POWER LOSS

TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE

CHARGE LOSS TRACKING THROUGH TARGETED BIT COUNT

DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES

APPARATUS WITH MEMORY CELL CALIBRATION MECHANISM AND METHODS FOR OP...

SLOW-CHARGE-LOSS TRACKING USING FEEDBACK-CONTROL LOOP

SLOW CHARGE LOSS MONITOR FOR POWER UP PERFORMANCE BOOSTING

TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS

CHARGE LOSS MITIGATION THROUGHOUT MEMORY DEVICE LIFECYCLE BY PROACT...

MEMORY READ VOLTAGE THRESHOLD TRACKING BASED ON MEMORY DEVICE-ORIGI...

THRESHOLD VOLTAGE BIN CALIBRATION AT MEMORY DEVICE POWER UP

DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR A...

BLOCK FAMILY-BASED ERROR AVOIDANCE FOR MEMORY DEVICES

TEMPERATURE-COMPENSATED TIME ESTIMATE FOR A BLOCK TO REACH A UNIFOR...

DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES

OPEN BLOCK FAMILY DURATION LIMITED BY TEMPERATURE VARIATION

MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE C...

ADAPTIVE CALIBRATION FOR THRESHOLD VOLTAGE OFFSET BINS

ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE

DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR A...

TWO-SIDED PAGE SCANS WITH CALIBRATION FEEDBACK

PROGRAM CONTINUATION STRATEGIES AFTER MEMORY DEVICE POWER LOSS

THRESHOLD VOLTAGE BIN CALIBRATION AT MEMORY DEVICE POWER UP

TEMPERATURE-COMPENSATED TIME ESTIMATE FOR A BLOCK TO REACH A UNIFOR...

TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE

MEASUREMENT OF REPRESENTATIVE CHARGE LOSS IN A BLOCK TO DETERMINE C...

TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS

DETERMINATION OF STATE METRICS OF MEMORY SUB-SYSTEMS FOLLOWING POWE...