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Steven Michnowski
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Wappingers Falls, NY, US
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Patents Grants
last 30 patents
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Patent Grant
ABIST-assisted detection of scan chain defects
Patent number
7,225,374
Issue date
May 29, 2007
International Business Machines Corporation
Todd Michael Burdine
G01 - MEASURING TESTING
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Patent Grant
Method and system for determining repeatable yield detractors of in...
Patent number
6,751,765
Issue date
Jun 15, 2004
International Business Machines Corporation
Richard F. Rizzolo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ABIST-assisted detection of scan chain defects
Publication number
20050138514
Publication date
Jun 23, 2005
International Business Machines Corporation
Todd Michael Burdine
G01 - MEASURING TESTING