Steven Oestreich

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Mesa, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for void characterization
- Patent number 6,801,596
- Issue date Oct 5, 2004
- KLA-Tencor Technologies Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically detecting defects in voltage co...
- Patent number 6,774,648
- Issue date Aug 10, 2004
- KLA-Tencor Technologies Corporation
- Jason C. H. Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus for void characterization
- Publication number 20030063705
- Publication date Apr 3, 2003
- KLA-Tencor Technologies Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING