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Steven P. Ecklund
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St. Anthony, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for dynamic path length control modulation
Patent number
9,829,320
Issue date
Nov 28, 2017
Honeywell International Inc.
Alan Bruce Touchberry
G01 - MEASURING TESTING
Information
Patent Grant
Minimally-threaded screw to reduce alignment shifts
Patent number
9,007,598
Issue date
Apr 14, 2015
Honeywell International Inc.
Matthew Clark
G01 - MEASURING TESTING
Information
Patent Grant
Variable path length control modulation frequency
Patent number
8,259,302
Issue date
Sep 4, 2012
Honeywell International Inc.
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for substrate surface evaluation
Patent number
7,312,866
Issue date
Dec 25, 2007
Honeywell International Inc.
Daniel R. Fashant
G02 - OPTICS
Information
Patent Grant
Methods and systems for substrate surface evaluation
Patent number
6,995,847
Issue date
Feb 7, 2006
Honeywell International Inc.
Daniel R. Fashant
G02 - OPTICS
Information
Patent Grant
Methods and apparatus for removing gases from enclosures
Patent number
6,931,711
Issue date
Aug 23, 2005
Honeywell International Inc.
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Grant
Current control biasing to protect electrode seals
Patent number
6,714,580
Issue date
Mar 30, 2004
Honeywell International Inc.
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Grant
High temperature electrode seal in a ring laser gyro
Patent number
6,704,111
Issue date
Mar 9, 2004
Honeywell International Inc.
Steven P. Ecklund
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR DYNAMIC PATH LENGTH CONTROL MODULATION
Publication number
20170115118
Publication date
Apr 27, 2017
HONEYWELL INTERNATIONAL INC.
Alan Bruce Touchberry
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE PATH LENGTH CONTROL MODULATION FREQUENCY
Publication number
20120026502
Publication date
Feb 2, 2012
Honeywell International Inc.
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Application
USE OF TOKEN SWITCH TO INDICATE UNAUTHORIZED MANIPULATION OF A PROT...
Publication number
20110199225
Publication date
Aug 18, 2011
Honeywell International Inc.
Alan B. Touchberry
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SYSTEMS AND METHODS FOR PACKAGING AND MOUNTING READOUT AND LASER IN...
Publication number
20080304076
Publication date
Dec 11, 2008
Honeywell International Inc.
Timothy A. Beckwith
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for substrate surface evaluation
Publication number
20060028654
Publication date
Feb 9, 2006
Daniel R. Fashant
G02 - OPTICS
Information
Patent Application
Methods and apparatus for removing gases from enclosures
Publication number
20040040941
Publication date
Mar 4, 2004
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE ELECTRODE SEAL IN A RING LASER GYRO
Publication number
20040008350
Publication date
Jan 15, 2004
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Application
CURRENT CONTROL BIASING TO PROTECT ELECTRODE SEALS
Publication number
20040008351
Publication date
Jan 15, 2004
Honeywell International Inc.
Steven P. Ecklund
G01 - MEASURING TESTING
Information
Patent Application
Methods and systems for substrate surface evaluation
Publication number
20030218742
Publication date
Nov 27, 2003
Daniel R. Fashant
G02 - OPTICS