Steven P. Reeves

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Data representation relating to a non-sampled workpiece
- Patent number 7,236,848
- Issue date Jun 26, 2007
- Advanced Micro Devices, Inc.
- Steven P. Reeves
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of monitoring anneal processes using scatterometry, and syst...
- Patent number 6,933,158
- Issue date Aug 23, 2005
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Structures for analyzing electromigration, and methods of using same
- Patent number 6,927,080
- Issue date Aug 9, 2005
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- G01 - MEASURING TESTING
Information Patent Grant
Method of using scatterometry for analysis of electromigration, and...
- Patent number 6,881,594
- Issue date Apr 19, 2005
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method of using high yielding spectra scatterometry measurements to...
- Patent number 6,785,009
- Issue date Aug 31, 2004
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring implant profiles using scatterometric technique...
- Patent number 6,660,543
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Data representation relating to a non-sampled workpiece
- Publication number 20070061032
- Publication date Mar 15, 2007
- Steven P. Reeves
- G05 - CONTROLLING REGULATING