Steven Qian

Follow

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for characterizing lithography effects on a wafer
- Patent number 7,537,939
- Issue date May 26, 2009
- NXP B.V.
- David Ziger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Characterizing Lithography Effects on a Wafer
- Publication number 20070275329
- Publication date Nov 29, 2007
- Koninklijke Philips Electronics N.V.
- David Ziger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY