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Steven R. Sauerbrunn
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Wilmington, DE, US
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last 30 patents
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Patent Grant
Method and apparatus for high resolution analysis
Patent number
5,368,391
Issue date
Nov 29, 1994
TA Instruments, Inc.
Benjamin S. Crowe
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for high resolution analysis
Patent number
5,165,792
Issue date
Nov 24, 1992
TA Instruments, Inc.
Benjamin S. Crowe
G01 - MEASURING TESTING