Steven Rothweiler

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Kunkletown, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Deriving signal constraints to accelerate sequential test generation
- Patent number 5,875,196
- Issue date Feb 23, 1999
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Testing and removal of redundancies in VLSI circuits with non-boole...
- Patent number 5,657,240
- Issue date Aug 12, 1997
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Eliminating retiming bottlenecks to improve performance of synchron...
- Patent number 5,553,000
- Issue date Sep 3, 1996
- NEC USA, Inc.
- Sujit Dey
- G06 - COMPUTING CALCULATING COUNTING