Steven SLUPSKY

Person

Edmonton, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Wireless sensor device
- Patent number 9,329,579
- Issue date May 3, 2016
- Scanimetrics Inc.
- Steven Slupsky
- G05 - CONTROLLING REGULATING
Information Patent Grant
Testing of electronic circuits using an active probe integrated cir...
- Patent number 8,928,343
- Issue date Jan 6, 2015
- Scanimetrics Inc.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interrogating electronic equipment components
- Patent number 8,829,934
- Issue date Sep 9, 2014
- Scanimetrics Inc.
- Christopher V. Sellathamby
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interconnect having ultra high speed signal transmission/reception
- Patent number 8,669,656
- Issue date Mar 11, 2014
- Scanimetrics Inc.
- Steven Slupsky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for interrogating an electronic component
- Patent number 8,390,307
- Issue date Mar 5, 2013
- Steven Slupsky
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interrogating an electronic component
- Patent number 8,373,429
- Issue date Feb 12, 2013
- Steven Slupsky
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high speed signal transmission/reception
- Patent number 8,362,481
- Issue date Jan 29, 2013
- Scanimetrics Inc.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high speed signal transmission/reception interconnect
- Patent number 8,362,587
- Issue date Jan 29, 2013
- Scanimetrics Inc.
- Christopher V. Sellatmamby
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Thin film transistor array having test circuitry
- Patent number 8,125,237
- Issue date Feb 28, 2012
- Scanimetrics Inc.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact tester for electronic circuits
- Patent number 7,109,730
- Issue date Sep 19, 2006
- Scanimetrics Inc.
- Steven Harold Slupsky
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact tester for electronic circuits
- Patent number 6,885,202
- Issue date Apr 26, 2005
- Scanimetrics Inc.
- Steven Harold Slupsky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Containment integrity sensor device
- Publication number 20150323435
- Publication date Nov 12, 2015
- Steven Slupsky
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIR...
- Publication number 20150276805
- Publication date Oct 1, 2015
- SCANIMETRICS INC.
- Steven SLUPSKY
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS SENSOR DEVICE
- Publication number 20130278377
- Publication date Oct 24, 2013
- Scanimetrics Inc.
- Steven SLUPSKY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT
- Publication number 20130207681
- Publication date Aug 15, 2013
- Steven Slupsky
- G01 - MEASURING TESTING
Information Patent Application
ULTRA HIGH SPEED SIGNAL TRANSMISSION/RECEPTION
- Publication number 20130135041
- Publication date May 30, 2013
- SCANIMETRICS INC.
- Steven SLUPSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA HIGH SPEED SIGNAL TRANSMISSION/RECEPTION
- Publication number 20110254123
- Publication date Oct 20, 2011
- SCANIMETRICS INC.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Application
ULTRA HIGH SPEED SIGNAL TRANSMISSION/RECEPTON
- Publication number 20110057291
- Publication date Mar 10, 2011
- SCANIMETRICS INC.
- Steven Slupsky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR INTERROGATING ELECTRONIC EQUIPMENT COMPONENTS
- Publication number 20110006794
- Publication date Jan 13, 2011
- SCANIMETRICS INC.
- Christopher V. Sellathamby
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIR...
- Publication number 20100164519
- Publication date Jul 1, 2010
- SCANIMETRICS INC.
- Christopher V. Sellathamby
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM TRANSISTOR ARRAY HAVING TEST CIRCUITRY
- Publication number 20090201042
- Publication date Aug 13, 2009
- SCANIMETRICS INC.
- Christopher V. Sellathamby
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT
- Publication number 20090072843
- Publication date Mar 19, 2009
- SCANIMETRICS INC.
- Steven Slupsky
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT
- Publication number 20090066356
- Publication date Mar 12, 2009
- SCANIMETRICS INC.
- Steven Slupsky
- G01 - MEASURING TESTING
Information Patent Application
Non-contact tester for electronic circuits
- Publication number 20060066326
- Publication date Mar 30, 2006
- Steven Harold Slupsky
- G01 - MEASURING TESTING
Information Patent Application
Embeddable single board computer
- Publication number 20040133720
- Publication date Jul 8, 2004
- Steven Slupsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Non-contact tester for electronic circuits
- Publication number 20040075453
- Publication date Apr 22, 2004
- Steven Harold Slupsky
- G01 - MEASURING TESTING

Steven SLUPSKY

Person

Patents Grantslast 30 patents

Wireless sensor device

Testing of electronic circuits using an active probe integrated cir...

Method and apparatus for interrogating electronic equipment components

Interconnect having ultra high speed signal transmission/reception

Method and apparatus for interrogating an electronic component

Method and apparatus for interrogating an electronic component

Ultra high speed signal transmission/reception

Ultra high speed signal transmission/reception interconnect

Thin film transistor array having test circuitry

Non-contact tester for electronic circuits

Non-contact tester for electronic circuits

Patents Applicationslast 30 patents

Containment integrity sensor device

TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIR...

WIRELESS SENSOR DEVICE

METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT

ULTRA HIGH SPEED SIGNAL TRANSMISSION/RECEPTION

ULTRA HIGH SPEED SIGNAL TRANSMISSION/RECEPTION

ULTRA HIGH SPEED SIGNAL TRANSMISSION/RECEPTON

METHOD AND APPARATUS FOR INTERROGATING ELECTRONIC EQUIPMENT COMPONENTS

TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIR...

THIN FILM TRANSISTOR ARRAY HAVING TEST CIRCUITRY

METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT

METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT

Non-contact tester for electronic circuits

Embeddable single board computer

Non-contact tester for electronic circuits