Steven Ulrich

Person

Houston, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 11,391,681
- Issue date Jul 19, 2022
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 10,876,982
- Issue date Dec 29, 2020
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 10,446,383
- Issue date Oct 15, 2019
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 9,297,761
- Issue date Mar 29, 2016
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight spectrometry and spectroscopy of surfaces
- Patent number 8,829,428
- Issue date Sep 9, 2014
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Nonoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 8,614,416
- Issue date Dec 24, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometry of surfaces
- Patent number 8,519,329
- Issue date Aug 27, 2013
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 8,492,710
- Issue date Jul 23, 2013
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometry of surfaces
- Patent number 8,101,909
- Issue date Jan 24, 2012
- Ionwerks, Inc.
- Thomas F. Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved dynamic range
- Patent number 7,800,054
- Issue date Sep 21, 2010
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 7,365,313
- Issue date Apr 29, 2008
- Ionwerks
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 7,084,393
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20210116402
- Publication date Apr 22, 2021
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20200013606
- Publication date Jan 9, 2020
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20170221691
- Publication date Aug 3, 2017
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20160189942
- Publication date Jun 30, 2016
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
- Publication number 20140084153
- Publication date Mar 27, 2014
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE
- Publication number 20120085898
- Publication date Apr 12, 2012
- Ionwerks, Inc.
- Thomas F. Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
- Publication number 20120018630
- Publication date Jan 26, 2012
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT SPECTROMETRY AND SPECTROSCOPY OF SURFACES
- Publication number 20110147578
- Publication date Jun 23, 2011
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...
- Publication number 20110049355
- Publication date Mar 3, 2011
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES
- Publication number 20090189072
- Publication date Jul 30, 2009
- Ionwerks, Inc.
- Thomas F. Egan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE
- Publication number 20090008545
- Publication date Jan 8, 2009
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Publication number 20060192111
- Publication date Aug 31, 2006
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Publication number 20050006577
- Publication date Jan 13, 2005
- IONWERKS
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS

Steven Ulrich

Person

Patents Grantslast 30 patents

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Time-of-flight spectrometry and spectroscopy of surfaces

Nonoparticulate assisted nanoscale molecular imaging by mass spectr...

Time-of-flight mass spectrometry of surfaces

Fast time-of-flight mass spectrometer with improved data acquisitio...

Time-of-flight mass spectrometry of surfaces

Fast time-of-flight mass spectrometer with improved dynamic range

Fast time-of-flight mass spectrometer with improved data acquisitio...

Fast time-of-flight mass spectrometer with improved data acquisitio...

Patents Applicationslast 30 patents

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...

TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE

Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...

TIME-OF-FLIGHT SPECTROMETRY AND SPECTROSCOPY OF SURFACES

FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...

TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES

FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE

Fast time-of-flight mass spectrometer with improved data acquisitio...

Fast time-of-flight mass spectrometer with improved data acquisitio...