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Steven W. Stanton
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Aloha, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Continuous RF signal visualization with high resolution
Patent number
10,198,835
Issue date
Feb 5, 2019
Tektronix, Inc.
Kyle L. Bernard
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System for improving probability of transient event detection
Patent number
9,886,419
Issue date
Feb 6, 2018
Tektronix, Inc.
Stephen D. Follett
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Frequency mask trigger with non-uniform bandwidth segments
Patent number
9,702,907
Issue date
Jul 11, 2017
Tektronix, Inc.
Steven W. Stanton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Time correlation of signal power to distortion characteristics
Patent number
7,751,470
Issue date
Jul 6, 2010
Tektronix, Inc.
Steven W. Stanton
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTINUOUS RF SIGNAL VISUALIZATION WITH HIGH RESOLUTION
Publication number
20170069119
Publication date
Mar 9, 2017
Tektronix, Inc.
Kyle L. Bernard
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR IMPROVING PROBABILITY OF TRANSIENT EVENT DETECTION
Publication number
20140032150
Publication date
Jan 30, 2014
Tektronix, Inc.
STEPHEN D. FOLLETT
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MASK TRIGGER WITH NON-UNIFORM BANDWIDTH SEGMENTS
Publication number
20130158923
Publication date
Jun 20, 2013
Tektronix, Inc.
STEVEN W. STANTON
G01 - MEASURING TESTING
Information
Patent Application
CONTINUOUS RF SIGNAL VISUALIZATION WITH HIGH RESOLUTION
Publication number
20120306886
Publication date
Dec 6, 2012
Tektronix, Inc.
KYLE L. BERNARD
G01 - MEASURING TESTING
Information
Patent Application
Time correlation of signal power to distortion characteristics
Publication number
20060176967
Publication date
Aug 10, 2006
Steven W. Stanton
G01 - MEASURING TESTING