Stewart Bean

Person

Cambridgeshire, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the lens detection o...
- Patent number 10,068,744
- Issue date Sep 4, 2018
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus having a selectively positionabl...
- Patent number 9,741,528
- Issue date Aug 22, 2017
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing a sample and charged particle beam device for a...
- Patent number 9,159,532
- Issue date Oct 13, 2015
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam devices
- Patent number 8,859,992
- Issue date Oct 14, 2014
- Carl Zeiss NTS Limited
- Stewart John Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system having a hollow light guide
- Patent number 8,648,301
- Issue date Feb 11, 2014
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope system, method for operating a charged-particle microscope
- Patent number 8,426,812
- Issue date Apr 23, 2013
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...
- Publication number 20170154752
- Publication date Jun 1, 2017
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...
- Publication number 20150348742
- Publication date Dec 3, 2015
- CARL ZEISS MICROSCOPY GMBH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...
- Publication number 20140197310
- Publication date Jul 17, 2014
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM SYSTEM HAVING A HOLLOW LIGHT GUIDE
- Publication number 20130075604
- Publication date Mar 28, 2013
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microscope System, Method for Operating a Charged-Particle Microscope
- Publication number 20120104250
- Publication date May 3, 2012
- CARL ZEISS NTS LTD.
- Stewart Bean
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM DEVICES
- Publication number 20120091337
- Publication date Apr 19, 2012
- Carl Zeiss NTS Limited
- Stewart John Bean
- H01 - BASIC ELECTRIC ELEMENTS

Stewart Bean

Person

Patents Grantslast 30 patents

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the lens detection o...

Charged particle optical apparatus having a selectively positionabl...

Method of analyzing a sample and charged particle beam device for a...

Charged particle beam devices

Particle beam system having a hollow light guide

Microscope system, method for operating a charged-particle microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...

METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR A...

PARTICLE BEAM SYSTEM HAVING A HOLLOW LIGHT GUIDE

Microscope System, Method for Operating a Charged-Particle Microscope

CHARGED PARTICLE BEAM DEVICES