Stojan Kanev

Person

Chu-pei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Probe system and machine apparatus thereof
- Patent number 12,196,779
- Issue date Jan 14, 2025
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating to distance between probe tip and device un...
- Patent number 11,287,475
- Issue date Mar 29, 2022
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station
- Patent number 11,262,401
- Issue date Mar 1, 2022
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Control method of touch display apparatus
- Patent number 11,144,198
- Issue date Oct 12, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display method of display apparatus
- Patent number 11,036,390
- Issue date Jun 15, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer probe station
- Patent number 10,895,587
- Issue date Jan 19, 2021
- MPI CORPORATION
- Yu-Hsun Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating probe misplacement and probe apparatus
- Patent number 10,312,123
- Issue date Jun 4, 2019
- MPI CORPORATION
- Chen-Ching Chen
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Grant
Wafer cassette
- Patent number 10,096,505
- Issue date Oct 9, 2018
- MPI CORPORATION
- Lin-Lin Chih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating method for inspecting equipment
- Patent number 10,048,844
- Issue date Aug 14, 2018
- MPI CORPORATION
- Stojan Kanev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...
- Publication number 20240219427
- Publication date Jul 4, 2024
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
- Publication number 20230059740
- Publication date Feb 23, 2023
- MPI Corporation
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COMPENSATING TO DISTANCE BETWEEN PROBE TIP AND DEVICE UN...
- Publication number 20210382108
- Publication date Dec 9, 2021
- MPI Corporation
- Stojan KANEV
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION
- Publication number 20210333322
- Publication date Oct 28, 2021
- MPI Corporation
- Stojan KANEV
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION
- Publication number 20200209279
- Publication date Jul 2, 2020
- MPI Corporation
- Yu-Hsun HSU
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY METHOD OF DISPLAY APPARATUS
- Publication number 20190361074
- Publication date Nov 28, 2019
- MPI Corporation
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL METHOD OF TOUCH DISPLAY APPARATUS
- Publication number 20190361603
- Publication date Nov 28, 2019
- MPI Corporation
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER CASSETTE
- Publication number 20170221733
- Publication date Aug 3, 2017
- MPI Corporation
- LIN-LIN CHIH
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Application
METHOD FOR COMPENSATING PROBE MISPLACEMENT AND PROBE APPARATUS
- Publication number 20170219650
- Publication date Aug 3, 2017
- MPI Corporation
- Chen-Ching Chen
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE
- Publication number 20170018068
- Publication date Jan 19, 2017
- MPI Corporation
- Stojan Kanev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATING METHOD FOR INSPECTING EQUIPMENT
- Publication number 20160210028
- Publication date Jul 21, 2016
- MPI Corporation
- Stojan Kanev
- G06 - COMPUTING CALCULATING COUNTING

Stojan Kanev

Person

Patents Grantslast 30 patents

Probe system and machine apparatus thereof

Method for compensating to distance between probe tip and device un...

Wafer probe station

Control method of touch display apparatus

Display method of display apparatus

Wafer probe station

Method for compensating probe misplacement and probe apparatus

Wafer cassette

Operating method for inspecting equipment

Patents Applicationslast 30 patents

POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...

PROBE SYSTEM AND MACHINE APPARATUS THEREOF

METHOD FOR COMPENSATING TO DISTANCE BETWEEN PROBE TIP AND DEVICE UN...

WAFER PROBE STATION

WAFER PROBE STATION

DISPLAY METHOD OF DISPLAY APPARATUS

CONTROL METHOD OF TOUCH DISPLAY APPARATUS

WAFER CASSETTE

METHOD FOR COMPENSATING PROBE MISPLACEMENT AND PROBE APPARATUS

PROBE DEVICE

OPERATING METHOD FOR INSPECTING EQUIPMENT