Stuart D Chaplan

Person

  • Watertown, MA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    System and method for hole inspection

    • Patent number 12,061,169
    • Issue date Aug 13, 2024
    • JENTEK Sensors, Inc.
    • Todd Dunford
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement system and method of use

    • Patent number 11,841,245
    • Issue date Dec 12, 2023
    • JENTEK Sensors, Inc.
    • Neil J Goldfine
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Measurement system and method of use

    • Patent number 11,549,831
    • Issue date Jan 10, 2023
    • JENTEK Sensors, Inc.
    • Neil J Goldfine
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement system and method of use

    • Patent number 10,416,118
    • Issue date Sep 17, 2019
    • JENTEK Sensors, Inc.
    • Neil J Goldfine
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Grant

    Portable test instrument

    • Patent number D857534
    • Issue date Aug 27, 2019
    • JENTEK Sensors, Inc.
    • Todd M Dunford
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Portable test instrument

    • Patent number D830863
    • Issue date Oct 16, 2018
    • Todd M Dunford
    • D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents