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Stuart D Chaplan
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Watertown, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for hole inspection
Patent number
12,061,169
Issue date
Aug 13, 2024
JENTEK Sensors, Inc.
Todd Dunford
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and method of use
Patent number
11,841,245
Issue date
Dec 12, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Measurement system and method of use
Patent number
11,549,831
Issue date
Jan 10, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and method of use
Patent number
10,416,118
Issue date
Sep 17, 2019
JENTEK Sensors, Inc.
Neil J Goldfine
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Portable test instrument
Patent number
D857534
Issue date
Aug 27, 2019
JENTEK Sensors, Inc.
Todd M Dunford
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Portable test instrument
Patent number
D830863
Issue date
Oct 16, 2018
Todd M Dunford
D10 - Measuring, testing, or signalling instruments
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20240255323
Publication date
Aug 1, 2024
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20230160728
Publication date
May 25, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20220373367
Publication date
Nov 24, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION
Publication number
20220341876
Publication date
Oct 27, 2022
JENTEK Sensors, Inc.
Todd Dunford
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION AND QUALIFICATION
Publication number
20220341875
Publication date
Oct 27, 2022
JENTEK Sensors, Inc.
Stuart Chaplan
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20210080297
Publication date
Mar 18, 2021
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY