Stuart Friedman

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Beam shaping optics of flow cytometer systems and methods related t...
- Patent number 11,262,288
- Issue date Mar 1, 2022
- John F. Heanue
- G01 - MEASURING TESTING
Information Patent Grant
Beam shaping optics of flow cytometer systems and methods related t...
- Patent number 10,830,686
- Issue date Nov 10, 2020
- Abbott Laboratories
- John F. Heanue
- G01 - MEASURING TESTING
Information Patent Grant
Optical source in microwave impedance microscopy
- Patent number 10,473,694
- Issue date Nov 12, 2019
- Primenano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Grant
Optically excited microwave impedance microscopy
- Patent number 10,274,513
- Issue date Apr 30, 2019
- Primenano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Grant
Beam shaping optics of flow cytometer systems and methods related t...
- Patent number 10,274,413
- Issue date Apr 30, 2019
- Abbott Laboratories
- John F. Heanue
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting a substrate
- Patent number 9,529,279
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- David Adler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Beam shaping optics of flow cytometer systems and methods related t...
- Patent number 9,523,857
- Issue date Dec 20, 2016
- Abbott Laboratories
- John F. Heanue
- G02 - OPTICS
Information Patent Grant
Beam shaping optics of flow cytometer systems and methods related t...
- Patent number 9,494,801
- Issue date Nov 15, 2016
- Abbott Laboratories
- John F. Heanue
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting a substrate
- Patent number 9,170,503
- Issue date Oct 27, 2015
- KLA-Tencor Corporation
- David Adler
- G01 - MEASURING TESTING
Information Patent Grant
Readout methodology for multi-channel acquisition of spatially dist...
- Patent number 8,941,049
- Issue date Jan 27, 2015
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Grant
Photomultiplier tube optimized for surface inspection in the ultrav...
- Patent number 8,629,384
- Issue date Jan 14, 2014
- KLA-Tencor Corporation
- Stephen Biellak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse focusing action in hyperbolic field detectors
- Patent number 8,237,120
- Issue date Aug 7, 2012
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for chemical defect characterization in high...
- Patent number 7,635,842
- Issue date Dec 22, 2009
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Grant
Image intensification for low light inspection
- Patent number 7,570,354
- Issue date Aug 4, 2009
- KLA-Tencor Corporation
- Wei Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a substrate
- Patent number 7,171,038
- Issue date Jan 30, 2007
- KLA-Tencor Technologies Corporation
- David Adler
- G01 - MEASURING TESTING
Information Patent Grant
Tandem microchannel plate and solid state electron detector
- Patent number 6,717,146
- Issue date Apr 6, 2004
- Applied Materials, Inc.
- Tai-Hon Philip Chang
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate electron multiplier
- Patent number 6,642,637
- Issue date Nov 4, 2003
- Applied Materials, Inc.
- James P Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated adjustment of an energy filtering transmission electron m...
- Patent number 5,798,524
- Issue date Aug 25, 1998
- Gatan, Inc.
- Michael Karl Kundmann
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Beam Shaping Optics of Flow Cytometer Systems and Methods Related T...
- Publication number 20210131943
- Publication date May 6, 2021
- Abbott Laboratories
- John F. Heanue
- G01 - MEASURING TESTING
Information Patent Application
BEAM SHAPING OPTICS OF FLOW CYTOMETER SYSTEMS AND METHODS RELATED T...
- Publication number 20190310180
- Publication date Oct 10, 2019
- Abbott Laboratories
- John F. Heanue
- G02 - OPTICS
Information Patent Application
Optical source in microwave impedance microscopy
- Publication number 20190234993
- Publication date Aug 1, 2019
- PrimeNano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Application
Optically excited microwave impedance microscopy
- Publication number 20180217181
- Publication date Aug 2, 2018
- PrimeNano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Application
Beam Shaping Optics of Flow Cytometer Systems and Methods Related T...
- Publication number 20170115202
- Publication date Apr 27, 2017
- Abbott Laboratories
- John F. Heanue
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE
- Publication number 20170074810
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- David L. ADLER
- G01 - MEASURING TESTING
Information Patent Application
Beam Shaping Optics of Flow Cytometer Systems and Methods Related T...
- Publication number 20140264097
- Publication date Sep 18, 2014
- John F. Heanue
- G02 - OPTICS
Information Patent Application
READOUT METHODOLOGY FOR MULTI-CHANNEL ACQUISITION OF SPATIALLY DIST...
- Publication number 20120029854
- Publication date Feb 2, 2012
- KLA-Tencor Corporation
- Gabor Toth
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND INSTRUMENT FOR CHEMICAL DEFECT CHARACTERIZATION IN HIGH...
- Publication number 20080197277
- Publication date Aug 21, 2008
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting a substrate
- Publication number 20070230768
- Publication date Oct 4, 2007
- KLA-Tencor Corporation
- David Adler
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting a substrate
- Publication number 20070025610
- Publication date Feb 1, 2007
- KLA-Tencor Corporation
- David Adler
- G01 - MEASURING TESTING
Information Patent Application
Tandem microchannel plate and solid state electron detector
- Publication number 20020175283
- Publication date Nov 28, 2002
- Etec Systems, Inc.
- Tai-Hon Philip Chang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting a substrate
- Publication number 20020161534
- Publication date Oct 31, 2002
- KLA-Tencor Corporation
- David Adler
- G01 - MEASURING TESTING

Stuart Friedman

Person

Patents Grantslast 30 patents

Beam shaping optics of flow cytometer systems and methods related t...

Beam shaping optics of flow cytometer systems and methods related t...

Optical source in microwave impedance microscopy

Optically excited microwave impedance microscopy

Beam shaping optics of flow cytometer systems and methods related t...

Method and apparatus for inspecting a substrate

Beam shaping optics of flow cytometer systems and methods related t...

Beam shaping optics of flow cytometer systems and methods related t...

Method and apparatus for inspecting a substrate

Readout methodology for multi-channel acquisition of spatially dist...

Photomultiplier tube optimized for surface inspection in the ultrav...

Transverse focusing action in hyperbolic field detectors

Method and instrument for chemical defect characterization in high...

Image intensification for low light inspection

Method and apparatus for inspecting a substrate

Tandem microchannel plate and solid state electron detector

Parallel plate electron multiplier

Automated adjustment of an energy filtering transmission electron m...

Patents Applicationslast 30 patents

Beam Shaping Optics of Flow Cytometer Systems and Methods Related T...

BEAM SHAPING OPTICS OF FLOW CYTOMETER SYSTEMS AND METHODS RELATED T...

Optical source in microwave impedance microscopy

Optically excited microwave impedance microscopy

Beam Shaping Optics of Flow Cytometer Systems and Methods Related T...

METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE

Beam Shaping Optics of Flow Cytometer Systems and Methods Related T...

READOUT METHODOLOGY FOR MULTI-CHANNEL ACQUISITION OF SPATIALLY DIST...

METHOD AND INSTRUMENT FOR CHEMICAL DEFECT CHARACTERIZATION IN HIGH...

Method and apparatus for inspecting a substrate

Method and apparatus for inspecting a substrate

Tandem microchannel plate and solid state electron detector

Method and apparatus for inspecting a substrate