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Stuart H. Urie
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Milford, NH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Data conversion diagnostic bit in a data converter
Patent number
7,602,328
Issue date
Oct 13, 2009
National Semiconductor Corporation
Stuart H Urie
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
RFID temperature logger incorporating a frequency ratio digitizing...
Patent number
7,474,230
Issue date
Jan 6, 2009
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Frequency ratio digitizing temperature sensor with linearity correc...
Patent number
7,331,708
Issue date
Feb 19, 2008
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing temperature measurement system and method of operation
Patent number
6,962,436
Issue date
Nov 8, 2005
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing ohmmeter system
Patent number
6,930,495
Issue date
Aug 16, 2005
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing ohmmeter system
Patent number
6,903,558
Issue date
Jun 7, 2005
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Grant
Digitizing temperature measurement system
Patent number
6,869,216
Issue date
Mar 22, 2005
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Data Conversion Diagnostic Bit In A Data Converter
Publication number
20080278357
Publication date
Nov 13, 2008
National Semiconductor Corporation
Stuart H. Urie
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
RFID Temperature Logger Incorporating A Frequency Ratio Digitizing...
Publication number
20070205916
Publication date
Sep 6, 2007
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING
Information
Patent Application
Frequency ratio digitizing temperature sensor with linearity correc...
Publication number
20070195856
Publication date
Aug 23, 2007
National Semiconductor Corporation
Eric D. Blom
G01 - MEASURING TESTING