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Stuart Sherwin
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San Jose, CA, US
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last 30 patents
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Patent Grant
Systems and methods for automated multi-zone detection and modeling
Patent number
10,340,165
Issue date
Jul 2, 2019
KLA-Tencor Corporation
Jeremy Nabeth
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method and system for determining in-plane distortions in a substrate
Patent number
10,024,654
Issue date
Jul 17, 2018
KLA-Tencor Corporation
Mark D. Smith
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Systems and Methods for Automated Multi-Zone Detection and Modeling
Publication number
20170287754
Publication date
Oct 5, 2017
KLA-Tencor Corporation
Jeremy Nabeth
G01 - MEASURING TESTING
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Patent Application
Method and System for Determining In-Plane Distortions in a Substrate
Publication number
20160290789
Publication date
Oct 6, 2016
KLA-Tencor Corporation
Mark D. Smith
G01 - MEASURING TESTING