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Stuart Wenzel
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San Francisco, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic components with plurality of contoured microelectronic s...
Patent number
7,675,301
Issue date
Mar 9, 2010
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Lithographic type microelectronic spring structures with improved c...
Patent number
7,524,194
Issue date
Apr 28, 2009
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Shaped spring
Patent number
7,458,816
Issue date
Dec 2, 2008
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for determining properties of a fluid
Patent number
7,353,695
Issue date
Apr 8, 2008
BioScale, Inc.
Eric Fitch
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for determining properties of a fluid
Patent number
7,263,874
Issue date
Sep 4, 2007
BioScale, Inc.
Eric Fitch
G01 - MEASURING TESTING
Information
Patent Grant
Test head assembly having paired contact structures
Patent number
7,245,137
Issue date
Jul 17, 2007
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Lithographic type microelectronic spring structures with improved c...
Patent number
7,189,077
Issue date
Mar 13, 2007
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Helical microelectronic contact and method for fabricating same
Patent number
7,131,848
Issue date
Nov 7, 2006
FormFactor, Inc.
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Methods of fabricating and using shaped springs
Patent number
7,127,811
Issue date
Oct 31, 2006
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Grant
Layered microelectronic contact and method for fabricating same
Patent number
7,005,751
Issue date
Feb 28, 2006
FormFactor, Inc.
Igor Y. Khandros
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Helical microelectronic contact and method for fabricating same
Patent number
6,948,940
Issue date
Sep 27, 2005
FormFactor, Inc.
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming microelectronic spring structures on a substrate
Patent number
6,939,474
Issue date
Sep 6, 2005
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Test head assembly for electronic components with plurality of cont...
Patent number
6,888,362
Issue date
May 3, 2005
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Forming tool for forming a contoured microelectronic spring mold
Patent number
6,780,001
Issue date
Aug 24, 2004
FormFactor, Inc.
Benjamin N. Eldridge
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of fabricating shaped springs
Patent number
6,640,432
Issue date
Nov 4, 2003
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRONIC COMPONENTS WITH PLURALITY OF CONTOURED MICROELECTRONIC S...
Publication number
20070269997
Publication date
Nov 22, 2007
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Determining Properties of a Fluid
Publication number
20070204679
Publication date
Sep 6, 2007
Eric Fitch
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF FABRICATING AND USING SHAPED SPRINGS
Publication number
20070054513
Publication date
Mar 8, 2007
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Application
Lithographic Type Microelectronic Spring Structures with Improved C...
Publication number
20070045874
Publication date
Mar 1, 2007
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for determining properties of a fluid
Publication number
20060277979
Publication date
Dec 14, 2006
Eric Fitch
G01 - MEASURING TESTING
Information
Patent Application
Layered microelectronic contact and method for fabricating same
Publication number
20060138677
Publication date
Jun 29, 2006
FormFactor, Inc.
Igor Y. Khandros
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Helical microelectronic contact and method for fabricating same
Publication number
20060024989
Publication date
Feb 2, 2006
FormFactor, Inc.
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
Method for forming microelectronic spring structures on a substrate
Publication number
20060019027
Publication date
Jan 26, 2006
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Electronic components with plurality of contoured microelectronic s...
Publication number
20050189956
Publication date
Sep 1, 2005
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Forming tool for forming a contoured microelectronic spring mold
Publication number
20050016251
Publication date
Jan 27, 2005
FormFactor, Inc.
Benjamin N. Eldridge
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Layered microelectronic contact and method for fabricating same
Publication number
20040201074
Publication date
Oct 14, 2004
FormFactor, Inc.
Igor Y. Khandros
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
HELICAL MICROELECTRONIC CONTACT AND METHOD FOR FABRICATING SAME
Publication number
20040203262
Publication date
Oct 14, 2004
FormFactor, Inc.
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
Methods of fabricating and using shaped springs
Publication number
20040038560
Publication date
Feb 26, 2004
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Application
Forming tool for forming a contoured microelectronic spring mold
Publication number
20030099737
Publication date
May 29, 2003
FormFactor, Inc.
Benjamin N. Eldridge
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Electronic components with plurality of contoured microelectronic s...
Publication number
20020055282
Publication date
May 9, 2002
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Method for forming microelectronic spring structures on a substrate
Publication number
20010044225
Publication date
Nov 22, 2001
Benjamin N. Eldridge
G01 - MEASURING TESTING