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Subhash Madhukar Deshmukh
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Pocatello, ID, US
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last 30 patents
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Patent Grant
Electrical diagnostic technique for silicon plasma-etch induced dam...
Patent number
6,271,539
Issue date
Aug 7, 2001
American Microsystems, Inc.
Mark Michael Nelson
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method for detecting and characterizing plasma-etch induced damage...
Patent number
6,265,729
Issue date
Jul 24, 2001
American Microsystems, Inc.
Mark Michael Nelson
H01 - BASIC ELECTRIC ELEMENTS