Subramanian Karthikeyan

Person

Schnecksville, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test device with heating circuit
- Patent number 7,804,291
- Issue date Sep 28, 2010
- Agere Systems Inc.
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Grant
Test semiconductor device and method for determining Joule heating...
- Patent number 7,388,395
- Issue date Jun 17, 2008
- Agere Systems Inc.
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having reduced intra-level and inter-level cap...
- Patent number 7,301,107
- Issue date Nov 27, 2007
- Agere Systems, Inc.
- Subramanian Karthikeyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask layer and dual damascene interconnect structure in a semicondu...
- Patent number 7,067,419
- Issue date Jun 27, 2006
- Agere Systems, INC
- Robert Y S Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test semiconductor device and method for determining Joule heating...
- Patent number 7,061,264
- Issue date Jun 13, 2006
- Agere Systems, INC
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method to avoid copper contamination of a via or dual damascene str...
- Patent number 7,005,375
- Issue date Feb 28, 2006
- Agere Systems Inc.
- Subramanian Karthikeyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for testing planarization systems and methods for u...
- Patent number 6,309,900
- Issue date Oct 30, 2001
- Agere Systems Guardian Corp.
- Alvaro Maury
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST DEVICE WITH HEATING CIRCUIT
- Publication number 20070168818
- Publication date Jul 19, 2007
- Agere Systems, Inc.
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Application
Test semiconductor device and method for determining Joule heating...
- Publication number 20060192584
- Publication date Aug 31, 2006
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Application
Test semiconductor device and method for determining Joule heating...
- Publication number 20060066337
- Publication date Mar 30, 2006
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test device with heating circuit
- Publication number 20060066335
- Publication date Mar 30, 2006
- Seung H. Kang
- G01 - MEASURING TESTING
Information Patent Application
Mask layer and dual damascene interconnect structure in a semicondu...
- Publication number 20040121579
- Publication date Jun 24, 2004
- Robert Y. S. Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure of a reducing intra-level and inter-level capa...
- Publication number 20040084761
- Publication date May 6, 2004
- Subramanian Karthikeyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to avoid copper contamination of a via or dual damascene str...
- Publication number 20040063307
- Publication date Apr 1, 2004
- Subramanian Karthikeyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure of a reducing intra-level and inter-level capa...
- Publication number 20030213617
- Publication date Nov 20, 2003
- Subramanian Karthikeyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mask layer and dual damascene interconnect structure in a semicondu...
- Publication number 20030119305
- Publication date Jun 26, 2003
- Robert Y. S. Huang
- H01 - BASIC ELECTRIC ELEMENTS

Subramanian Karthikeyan

Person

Patents Grantslast 30 patents

Semiconductor test device with heating circuit

Test semiconductor device and method for determining Joule heating...

Semiconductor device having reduced intra-level and inter-level cap...

Mask layer and dual damascene interconnect structure in a semicondu...

Test semiconductor device and method for determining Joule heating...

Method to avoid copper contamination of a via or dual damascene str...

Test structures for testing planarization systems and methods for u...

Patents Applicationslast 30 patents

SEMICONDUCTOR TEST DEVICE WITH HEATING CIRCUIT

Test semiconductor device and method for determining Joule heating...

Test semiconductor device and method for determining Joule heating...

Semiconductor test device with heating circuit

Mask layer and dual damascene interconnect structure in a semicondu...

Method and structure of a reducing intra-level and inter-level capa...

Method to avoid copper contamination of a via or dual damascene str...

Method and structure of a reducing intra-level and inter-level capa...

Mask layer and dual damascene interconnect structure in a semicondu...