Subramanian Venkatkrishnan

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting a semiconductor wafer for defects
- Patent number 6,403,385
- Issue date Jun 11, 2002
- Advanced Micro Devices, Inc.
- Subramanian Venkatkrishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Elimination of residual materials in a multiple-layer interconnect...
- Patent number 6,153,933
- Issue date Nov 28, 2000
- Advanced Micro Devices, Inc.
- Darin A. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Doubled-sided wafer scrubbing for improved photolithography
- Patent number 6,136,510
- Issue date Oct 24, 2000
- Advanced Micro Devices, Inc.
- Tho Le La
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Backside wafer polishing for improved photolithography
- Patent number 5,780,204
- Issue date Jul 14, 1998
- Advanced Micro Devices, Inc.
- Tho Le La
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Chemical-mechanical polishing of thin materials using non-baked car...
- Patent number 5,769,696
- Issue date Jun 23, 1998
- Advanced Micro Devices, Inc.
- Dawn M. Lee
- B24 - GRINDING POLISHING
Information Patent Grant
Chemical-mechanical polishing using curved carriers
- Patent number 5,766,058
- Issue date Jun 16, 1998
- Advanced Micro Devices, Inc.
- Dawn M. Lee
- B24 - GRINDING POLISHING