Sudeep Bhattacharjee

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Kanpur, IN

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Patents Grantslast 30 patents

Information Patent Grant
System and method for characterizing focused charged beams
- Patent number 9,733,366
- Issue date Aug 15, 2017
- Indian Institute of Technology Kanpur
- Sudeep Bhattacharjee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CHARACTERIZING FOCUSED CHARGED BEAMS
- Publication number 20150041667
- Publication date Feb 12, 2015
- Indian Institute of Technology Kanpur
- Sudeep Bhattacharjee
- G01 - MEASURING TESTING