Sudeep Kumar Lahiri

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods for monitoring thickness of a conductive layer
- Patent number 9,007,059
- Issue date Apr 14, 2015
- Novellus Systems, Inc.
- Sudeep Kumar Lahiri
- B24 - GRINDING POLISHING
Information Patent Grant
Methods and apparatuses for determining thickness of a conductive l...
- Patent number 8,106,651
- Issue date Jan 31, 2012
- Novellus Systems, Inc.
- Sudeep Kumar Lahiri
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUSES FOR DETERMINING THICKNESS OF A CONDUCTIVE L...
- Publication number 20120129277
- Publication date May 24, 2012
- Novellus Systems, Inc.
- Sudeep Kumar Lahiri
- B24 - GRINDING POLISHING
Information Patent Application
METHODS AND APPARATUSES FOR DETERMINING THICKNESS OF A CONDUCTIVE L...
- Publication number 20090263918
- Publication date Oct 22, 2009
- Novellus Systems, Inc.
- Sudeep Kumar Lahiri
- B24 - GRINDING POLISHING