Sudesh Saroop

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-height fin field effect transistors
- Patent number 9,640,552
- Issue date May 2, 2017
- GLOBALFOUNDRIES Inc.
- Pranita Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage measurement of through silicon vias
- Patent number 8,835,194
- Issue date Sep 16, 2014
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage measurement structure having through silicon vias
- Patent number 8,692,246
- Issue date Apr 8, 2014
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, system and program storage device for simulating electronic...
- Patent number 8,515,715
- Issue date Aug 20, 2013
- International Business Machines Corporation
- Pamela Castalino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Robust local bit select circuitry to overcome timing mismatch
- Patent number 8,184,475
- Issue date May 22, 2012
- International Business Machines Corporation
- Rajiv V. Joshi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURES FOR A VERTICAL VARACTOR DIODE AND RELATED METHODS
- Publication number 20240072180
- Publication date Feb 29, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Saloni Chaurasia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-HEIGHT FIN FIELD EFFECT TRANSISTORS
- Publication number 20150287743
- Publication date Oct 8, 2015
- International Business Machines Corporation
- Pranita Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-HEIGHT FIN FIELD EFFECT TRANSISTORS
- Publication number 20150287809
- Publication date Oct 8, 2015
- International Business Machines Corporation
- Pranita Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE MEASUREMENT OF THROUGH SILICON VIAS
- Publication number 20140065738
- Publication date Mar 6, 2014
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE MEASUREMENT OF THROUGH SILICON VIAS
- Publication number 20130069062
- Publication date Mar 21, 2013
- International Business Machines Corporation
- Bhavana Bhoovaraghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, SYSTEM AND PROGRAM STORAGE DEVICE FOR SIMULATING ELECTRONIC...
- Publication number 20120323548
- Publication date Dec 20, 2012
- International Business Machines Corporation
- Pamela Castalino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROBUST LOCAL BIT SELECT CIRCUITRY TO OVERCOME TIMING MISMATCH
- Publication number 20110199817
- Publication date Aug 18, 2011
- International Business Machines Corporation
- Rajiv V. Joshi
- G11 - INFORMATION STORAGE

Sudesh Saroop

Person

Patents Grantslast 30 patents

Multi-height fin field effect transistors

Leakage measurement of through silicon vias

Leakage measurement structure having through silicon vias

Method, system and program storage device for simulating electronic...

Robust local bit select circuitry to overcome timing mismatch

Patents Applicationslast 30 patents

STRUCTURES FOR A VERTICAL VARACTOR DIODE AND RELATED METHODS

MULTI-HEIGHT FIN FIELD EFFECT TRANSISTORS

MULTI-HEIGHT FIN FIELD EFFECT TRANSISTORS

LEAKAGE MEASUREMENT OF THROUGH SILICON VIAS

LEAKAGE MEASUREMENT OF THROUGH SILICON VIAS

METHOD, SYSTEM AND PROGRAM STORAGE DEVICE FOR SIMULATING ELECTRONIC...

ROBUST LOCAL BIT SELECT CIRCUITRY TO OVERCOME TIMING MISMATCH