Sudhakar M. Reddy

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Iowa City, IA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scheduling the concurrent testing of multiple cores embedded in an...
- Patent number 6,934,897
- Issue date Aug 23, 2005
- Nilanjan Mukherjee
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test pattern for semiconductor integrated cir...
- Patent number 6,799,292
- Issue date Sep 28, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scheduling the concurrent testing of multiple cores embedded in an...
- Publication number 20030191996
- Publication date Oct 9, 2003
- Nilanjan Mukherjee
- G01 - MEASURING TESTING
Information Patent Application
Method for generating test pattern for semiconductor integrated cir...
- Publication number 20010029593
- Publication date Oct 11, 2001
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sadami Takeoka
- G01 - MEASURING TESTING