Sudipta Bhawmik

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Bridgewater, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method of testing through-silicon vias of a semiconducto...
- Patent number 8,806,400
- Issue date Aug 12, 2014
- QUALCOMM Incorporated
- Sudipta Bhawmik
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF TESTING THROUGH-SILICON VIAS OF A SEMICONDUCTO...
- Publication number 20140208279
- Publication date Jul 24, 2014
- QUALCOMM Incorporated
- Sudipta Bhawmik
- G01 - MEASURING TESTING
Information Patent Application
TEST CONTROLLER FOR 3D STACKED INTEGRATED CIRCUITS
- Publication number 20130197851
- Publication date Aug 1, 2013
- QUALCOMM Incorporated
- Sudipta Bhawmik
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN ACCESS IN 3D STACKED INTEGRATED CIRCUITS
- Publication number 20130185608
- Publication date Jul 18, 2013
- QUALCOMM Incorporated
- Sudipta Bhawmik
- G01 - MEASURING TESTING