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SUDOU SATOSHI
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TOKYO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Variable delay circuit, testing apparatus, and electronic device
Patent number
7,755,407
Issue date
Jul 13, 2010
Advantest Corporation
Takuya Hasumi
G01 - MEASURING TESTING
Information
Patent Grant
Consumption current balance circuit, compensation current amount ad...
Patent number
7,558,692
Issue date
Jul 7, 2009
Advantest Corp.
Masakatsu Suda
G01 - MEASURING TESTING
Information
Patent Grant
Multi-strobe apparatus, testing apparatus, and adjusting method
Patent number
7,406,646
Issue date
Jul 29, 2008
Advantest Corporation
Shinya Sato
G11 - INFORMATION STORAGE
Information
Patent Grant
Variable delay circuit
Patent number
7,071,746
Issue date
Jul 4, 2006
Advantest Corporation
Masakatsu Suda
G01 - MEASURING TESTING
Information
Patent Grant
Timing comparator, data sampling apparatus, and testing apparatus
Patent number
7,034,723
Issue date
Apr 25, 2006
Advantest Corporation
Masakatsu Suda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Clock recovery circuit and communication device
Patent number
6,987,410
Issue date
Jan 17, 2006
Advantest Corporation
Masakatsu Suda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Semiconductor device tester
Patent number
6,903,566
Issue date
Jun 7, 2005
Advantest Corporation
Satoshi Sudou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VARIABLE DELAY CIRCUIT, TESTING APPARATUS, AND ELECTRONIC DEVICE
Publication number
20090039939
Publication date
Feb 12, 2009
Advantest Corporation
TAKUYA HASUMI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Consumption Current Balance Circuit, Compensation Current Amount Ad...
Publication number
20080116901
Publication date
May 22, 2008
Masakatsu Suda
G01 - MEASURING TESTING
Information
Patent Application
Variable delay circuit
Publication number
20060170472
Publication date
Aug 3, 2006
Advantest Corporation
Masakatsu Suda
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Clock recovery circuit and communication device
Publication number
20050110544
Publication date
May 26, 2005
Advantest Corporation
Masakatsu Suda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Variable delay circuit
Publication number
20050110548
Publication date
May 26, 2005
Masakatsu Suda
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Timing comparator, data sampling apparatus, and testing apparatus
Publication number
20050111602
Publication date
May 26, 2005
Advantest Corporation
Masakatsu Suda
H04 - ELECTRIC COMMUNICATION TECHNIQUE