Sugao Fujinaga

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation device for evaluating semiconductor device
- Patent number 6,927,594
- Issue date Aug 9, 2005
- Matsushita Electric Industrial Co., Ltd.
- Sugao Fujinaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with a particular DMISFET structure
- Patent number 5,905,284
- Issue date May 18, 1999
- Matsushita Electric Industrial Co., Ltd.
- Taizo Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 5,851,863
- Issue date Dec 22, 1998
- Matsushita Electric Industrial Co., Ltd.
- Taizo Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 5,817,551
- Issue date Oct 6, 1998
- Matsushita Electric Industrial Co., Ltd.
- Taizo Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cleaning semiconductor wafers
- Patent number 5,415,698
- Issue date May 16, 1995
- Matsushita Electric Industrial Co., Ltd.
- Sugao Fujinaga
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Evaluation device for evaluating semiconductor device
- Publication number 20040257104
- Publication date Dec 23, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sugao Fujinaga
- G11 - INFORMATION STORAGE