Suguru Sasaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Structure for battery analysis and X-ray diffraction device
- Patent number 12,080,858
- Issue date Sep 3, 2024
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of correcting mask pattern
- Patent number 7,459,243
- Issue date Dec 2, 2008
- Oki Electric Industry Co., Ltd.
- Suguru Sasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Linear grating formation method
- Patent number 7,312,019
- Issue date Dec 25, 2007
- Oki Electric Industry Co., Ltd.
- Suguru Sasaki
- G02 - OPTICS
Information Patent Grant
Semiconductor device and semiconductor wafer
- Patent number 7,180,199
- Issue date Feb 20, 2007
- Oki Electric Industry Co., Ltd.
- Satoshi Machida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization method of aperture type of projection aligner
- Patent number 6,999,160
- Issue date Feb 14, 2006
- Oki Electric Industry Co., Ltd.
- Suguru Sasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process for forming a pattern
- Patent number 6,989,333
- Issue date Jan 24, 2006
- Oki Electric Industry Co., Ltd.
- Minoru Watanabe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE FOR BATTERY ANALYSIS AND X-RAY DIFFRACTION DEVICE
- Publication number 20220278381
- Publication date Sep 1, 2022
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Alignment mark and overlay inspection mark
- Publication number 20070176305
- Publication date Aug 2, 2007
- OKI ELECTRIC INDUSTRY CO.,LTD.
- Suguru Sasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device and semiconductor wafer
- Publication number 20060197237
- Publication date Sep 7, 2006
- Satoshi Machida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming alignment mark and method of manufacturing semico...
- Publication number 20060183293
- Publication date Aug 17, 2006
- Oki Electric Industry Co., Ltd.
- Suguru SASAKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Linear grating formation method
- Publication number 20050196709
- Publication date Sep 8, 2005
- Suguru Sasaki
- G02 - OPTICS
Information Patent Application
Method of correcting mask pattern
- Publication number 20050136339
- Publication date Jun 23, 2005
- Suguru Sasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optimization method of aperture type of projection aligner
- Publication number 20040141167
- Publication date Jul 22, 2004
- Suguru Sasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process for forming a pattern
- Publication number 20040121594
- Publication date Jun 24, 2004
- Minoru Watanabe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Suguru Sasaki

Person

Patents Grantslast 30 patents

Structure for battery analysis and X-ray diffraction device

Method of correcting mask pattern

Linear grating formation method

Semiconductor device and semiconductor wafer

Optimization method of aperture type of projection aligner

Process for forming a pattern

Patents Applicationslast 30 patents

STRUCTURE FOR BATTERY ANALYSIS AND X-RAY DIFFRACTION DEVICE

Alignment mark and overlay inspection mark

Semiconductor device and semiconductor wafer

Method of forming alignment mark and method of manufacturing semico...

Linear grating formation method

Method of correcting mask pattern

Optimization method of aperture type of projection aligner

Process for forming a pattern