Suhwan PARK

Person

Incheon, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate processing apparatus and semiconductor subs...
- Patent number 12,165,933
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Inkeun Baek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method using same
- Patent number 11,946,881
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection apparatuses
- Patent number 11,688,623
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Racine Elysia Auxter Nassau
- G01 - MEASURING TESTING
Information Patent Grant
Probe for detecting near field and near-field detection system incl...
- Patent number 11,579,167
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Jongmin Yoon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240234216
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN-FILM DEPOSITION APPARATUS
- Publication number 20240218561
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Janghwi Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
IMMERSION LITHOGRAPHIC SYSTEM
- Publication number 20240152058
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Wonki LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240136232
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHOCK ABSORBING PLATE AND SUBSTRATE PROCESSING APPARATUS INCLUDING...
- Publication number 20240021414
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Suhwan Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20240019362
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Junbum Park
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ PROBE
- Publication number 20230417820
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
- Publication number 20230204503
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING SAME
- Publication number 20220412898
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTION SYSTEM INCL...
- Publication number 20220082584
- Publication date Mar 17, 2022
- Samsung Electronics Co., Ltd.
- Jongmin YOON
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS AND SEMICONDUCTOR SUBS...
- Publication number 20220037215
- Publication date Feb 3, 2022
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS OF WAFER
- Publication number 20210366102
- Publication date Nov 25, 2021
- Samsung Electronics Co., Ltd.
- Suhwan PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION APPARATUSES
- Publication number 20210057262
- Publication date Feb 25, 2021
- Samsung Electronics Co., Ltd.
- Racine Elysia Auxter NASSAU
- H01 - BASIC ELECTRIC ELEMENTS

Suhwan PARK

Person

Patents Grantslast 30 patents

Inspection apparatus and method of inspecting wafer

Semiconductor substrate processing apparatus and semiconductor subs...

Inspection apparatus and inspection method using same

Wafer inspection apparatuses

Probe for detecting near field and near-field detection system incl...

Patents Applicationslast 30 patents

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

THIN-FILM DEPOSITION APPARATUS

IMMERSION LITHOGRAPHIC SYSTEM

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

SHOCK ABSORBING PLATE AND SUBSTRATE PROCESSING APPARATUS INCLUDING...

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

TERAHERTZ PROBE

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER

INSPECTION APPARATUS AND INSPECTION METHOD USING SAME

PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTION SYSTEM INCL...

SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS AND SEMICONDUCTOR SUBS...

INSPECTION APPARATUS OF WAFER

WAFER INSPECTION APPARATUSES