Suk Jin JUNG

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Gumi-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Polishing measurement device and abrasion time controlling method t...
- Patent number 11,389,922
- Issue date Jul 19, 2022
- SK SILTRON CO., LTD.
- Kee Yun Han
- B24 - GRINDING POLISHING
Information Patent Grant
Wafer carrier thickness measuring device
- Patent number 11,371,829
- Issue date Jun 28, 2022
- SK SILTRON CO., LTD.
- Suk Jin Jung
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POLISHING MEASUREMENT DEVICE AND ABRASION TIME CONTROLLING METHOD T...
- Publication number 20210205948
- Publication date Jul 8, 2021
- SK SILTRON CO., LTD.
- Kee Yun HAN
- B24 - GRINDING POLISHING
Information Patent Application
WAFER CARRIER THICKNESS MEASURING DEVICE
- Publication number 20210164769
- Publication date Jun 3, 2021
- SK SILTRON CO., LTD.
- Suk Jin JUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING DEVICE AND SCANNING SYSTEM FOR WAFER POLISHING APPARATUS
- Publication number 20180335302
- Publication date Nov 22, 2018
- SK SILTRON CO., LTD.
- Suk Jin JUNG
- B24 - GRINDING POLISHING