Sukehiro Ito

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device, sample observation method, sample pla...
- Patent number 10,241,062
- Issue date Mar 26, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device, image generation method, observation...
- Patent number 9,824,854
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,673,020
- Issue date Jun 6, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,543,111
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample base, charged particle beam device and sample observation me...
- Patent number 9,508,527
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and optical axis adjustment method
- Patent number 9,466,457
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle-beam device and specimen observation method
- Patent number 9,466,460
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,418,818
- Issue date Aug 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,287,083
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Shinichi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,263,232
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 9,236,217
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,208,995
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device with bandpass detection
- Patent number 9,202,667
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,165,741
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,105,442
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle radiation apparatus
- Patent number 9,053,902
- Issue date Jun 9, 2015
- Hitachi High-Technologies Corporation
- Yuta Ebine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,029,766
- Issue date May 12, 2015
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inclined observation image display...
- Patent number 9,012,842
- Issue date Apr 21, 2015
- Hitachi High-Technologies Corporation
- Wataru Kotake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 8,933,400
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,921,786
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric field discharge-type electron source
- Patent number 8,866,371
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,809,782
- Issue date Aug 19, 2014
- Hitachi High-Technologies Corporation
- Tomohisa Ohtaki
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,710,439
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device
- Patent number 8,692,195
- Issue date Apr 8, 2014
- Hitachi High-Technologies Corporation
- Sukehiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,629,395
- Issue date Jan 14, 2014
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device
- Patent number 8,294,097
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Junichi Katane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,143,573
- Issue date Mar 27, 2012
- Hitachi High-Technologies Corporation
- Sukehiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,097,848
- Issue date Jan 17, 2012
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for charged particle bea...
- Patent number 8,026,491
- Issue date Sep 27, 2011
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,755,045
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...
- Publication number 20160329188
- Publication date Nov 10, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device and Specimen Observation Method
- Publication number 20160126058
- Publication date May 5, 2016
- Hitach Hight-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Sample Observation Method, Sample Pla...
- Publication number 20160025659
- Publication date Jan 28, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...
- Publication number 20150380208
- Publication date Dec 31, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Base, Charged Particle Beam Device and Sample Observation Me...
- Publication number 20150318143
- Publication date Nov 5, 2015
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Observation Apparatus and Optical Axis Adjustment Method
- Publication number 20150228448
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20150228447
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150213999
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20150129763
- Publication date May 14, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20150083908
- Publication date Mar 26, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150076347
- Publication date Mar 19, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150014530
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY...
- Publication number 20150001393
- Publication date Jan 1, 2015
- Wataru Kotake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20140361167
- Publication date Dec 11, 2014
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE RADIATION APPARATUS
- Publication number 20140284477
- Publication date Sep 25, 2014
- Yuta Ebine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20140246583
- Publication date Sep 4, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE
- Publication number 20140197725
- Publication date Jul 17, 2014
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140175278
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...
- Publication number 20140151553
- Publication date Jun 5, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140021347
- Publication date Jan 23, 2014
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20130313430
- Publication date Nov 28, 2013
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20130299715
- Publication date Nov 14, 2013
- Hitachi High-Technologies Corporation
- Shinichi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20130043388
- Publication date Feb 21, 2013
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20130026363
- Publication date Jan 31, 2013
- Hitachi High-Technologies Corporation
- Junichi KATANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20120298864
- Publication date Nov 29, 2012
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120127299
- Publication date May 24, 2012
- Tomohisa Ohtaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20110291010
- Publication date Dec 1, 2011
- Junichi Katane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20100090109
- Publication date Apr 15, 2010
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20090322973
- Publication date Dec 31, 2009
- Hitachi High-Technologies Corporation
- Sukehiro ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090230304
- Publication date Sep 17, 2009
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS

Sukehiro Ito

Person

Patents Grantslast 30 patents

Charged particle beam device, sample observation method, sample pla...

Charged particle beam device, image generation method, observation...

Charged particle beam device, method for adjusting charged particle...

Charged particle beam device

Sample base, charged particle beam device and sample observation me...

Observation apparatus and optical axis adjustment method

Charged particle-beam device and specimen observation method

Charged particle beam device and sample observation method

Charged particle beam device

Charged particle beam device

Inspection or observation apparatus and sample inspection or observ...

Charged particle beam apparatus

Charged particle radiation device with bandpass detection

Charged particle beam device, method for adjusting charged particle...

Charged particle beam apparatus

Charged-particle radiation apparatus

Scanning electron microscope

Charged particle beam device and inclined observation image display...

Inspection or observation apparatus and sample inspection or observ...

Charged particle beam apparatus

Electric field discharge-type electron source

Scanning electron microscope

Charged particle beam apparatus

Charged particle radiation device

Charged particle beam apparatus

Charged particle radiation device

Charged particle beam apparatus

Scanning electron microscope

Charged particle beam apparatus and method for charged particle bea...

Scanning electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...

Charged-Particle-Beam Device and Specimen Observation Method

Charged Particle Beam Device, Sample Observation Method, Sample Pla...

CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...

Sample Base, Charged Particle Beam Device and Sample Observation Me...

Observation Apparatus and Optical Axis Adjustment Method

Charged Particle Beam Device and Sample Observation Method

Charged Particle Beam Apparatus

Charged Particle Beam Device

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY...

SCANNING ELECTRON MICROSCOPE

CHARGED-PARTICLE RADIATION APPARATUS

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE RADIATION DEVICE

CHARGED PARTICLE RADIATION DEVICE

Charged Particle Beam Apparatus

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE RADIATION DEVICE

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM APPARATUS

SCANNING ELECTRON MICROSCOPE