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Sukhjinder S. Deo
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Tewksbury, MA, US
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last 30 patents
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Patent Grant
Peak-to-average measurement with envelope pre-detection
Patent number
8,072,205
Issue date
Dec 6, 2011
Analog Devices, Inc.
Sukhjinder Deo
G01 - MEASURING TESTING
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Patent Grant
PTATn bias cell for improved temperature performance
Patent number
7,372,317
Issue date
May 13, 2008
Analog Devices, Inc.
Moshe Gerstenhaber
G05 - CONTROLLING REGULATING