TREA

Sukru Yilmaz

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  • Berlin, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Refractometer
    • Patent number 6,876,444
    • Issue date Apr 5, 2005
    • Franz Schmidt & Haensch GmbH & Co.
    • Sükrü Yilmaz
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Device for Centerpoint Wavelength Adjustment of Emitted Optical Rad...
    • Publication number 20110012513
    • Publication date Jan 20, 2011
    • Schmidt + Haensch GmbH & Co.
    • Sükrü YILMAZ
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Refractometer
    • Publication number 20070195312
    • Publication date Aug 23, 2007
    • Sukru Yilmaz
    • G01 - MEASURING TESTING
  • Information Patent Application

    Refractometer
    • Publication number 20030156278
    • Publication date Aug 21, 2003
    • Sukru Yilmaz
    • G01 - MEASURING TESTING