Sumant Kale

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adaptive voltage scaling system for out of context functional safet...
- Patent number 11,923,836
- Issue date Mar 5, 2024
- Texas Instruments Incorporated
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On chip power on reset with integrated supervisory functions for a...
- Patent number 11,269,389
- Issue date Mar 8, 2022
- Texas Instruments Incorporated
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive voltage scaling system for out of context functional safet...
- Patent number 10,734,993
- Issue date Aug 4, 2020
- Texas Instruments Incorporated
- Venkateswar Reddy Kowkutla
- G05 - CONTROLLING REGULATING
Information Patent Grant
On chip power on reset with integrated supervisory functions for a...
- Patent number 10,613,604
- Issue date Apr 7, 2020
- Texas Instruments Incorporated
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parallel memory self-testing
- Patent number 10,600,495
- Issue date Mar 24, 2020
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Centralized built-in soft-repair architecture for integrated circui...
- Patent number 10,134,483
- Issue date Nov 20, 2018
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On chip redundant system reset for out of context functional safety...
- Patent number 10,050,617
- Issue date Aug 14, 2018
- Texas Instruments Incorporated
- Venkateswar Reddy Kowkutla
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Packet based integrated circuit testing
- Patent number 9,702,935
- Issue date Jul 11, 2017
- Texas Instruments Incorporated
- Lewis Nardini
- G01 - MEASURING TESTING
Information Patent Grant
Clock control of pipelined memory for improved delay fault testing
- Patent number 8,694,843
- Issue date Apr 8, 2014
- Texas Instruments Incorporated
- Ramakrishnan Venkatasubramanian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADAPTIVE VOLTAGE SCALING SYSTEM FOR OUT OF CONTEXT FUNCTIONAL SAFET...
- Publication number 20240178832
- Publication date May 30, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE VOLTAGE SCALING SYSTEM FOR OUT OF CONTEXT FUNCTIONAL SAFET...
- Publication number 20200328738
- Publication date Oct 15, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON CHIP POWER ON RESET WITH INTEGRATED SUPERVISORY FUNCTIONS FOR A...
- Publication number 20200209931
- Publication date Jul 2, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARALLEL MEMORY SELF-TESTING
- Publication number 20180374556
- Publication date Dec 27, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
ADAPTIVE VOLTAGE SCALING SYSTEM FOR OUT OF CONTEXT FUNCTIONAL SAFET...
- Publication number 20180191343
- Publication date Jul 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Venkateswar Reddy Kowkutla
- G05 - CONTROLLING REGULATING
Information Patent Application
ON CHIP POWER ON RESET WITH INTEGRATED SUPERVISORY FUNCTIONS FOR A...
- Publication number 20180181179
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Venkateswar Reddy Kowkutla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON CHIP REDUNDANT SYSTEM RESET FOR OUT OF CONTEXT FUNCTIONAL SAFETY...
- Publication number 20180183434
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Venkateswar Reddy Kowkutla
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Centralized Built-In Soft-Repair Architecture for Integrated Circui...
- Publication number 20170184662
- Publication date Jun 29, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G01 - MEASURING TESTING
Information Patent Application
PACKET BASED INTEGRATED CIRCUIT TESTING
- Publication number 20150067426
- Publication date Mar 5, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Lewis Nardini
- G01 - MEASURING TESTING
Information Patent Application
Clock Control of Pipelined Memory for Improved Delay Fault Testing
- Publication number 20130036337
- Publication date Feb 7, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Ramakrishnan Venkatasubramanian
- G01 - MEASURING TESTING

Sumant Kale

Person

Patents Grantslast 30 patents

Adaptive voltage scaling system for out of context functional safet...

On chip power on reset with integrated supervisory functions for a...

Adaptive voltage scaling system for out of context functional safet...

On chip power on reset with integrated supervisory functions for a...

Parallel memory self-testing

Centralized built-in soft-repair architecture for integrated circui...

On chip redundant system reset for out of context functional safety...

Packet based integrated circuit testing

Clock control of pipelined memory for improved delay fault testing

Patents Applicationslast 30 patents

ADAPTIVE VOLTAGE SCALING SYSTEM FOR OUT OF CONTEXT FUNCTIONAL SAFET...

ADAPTIVE VOLTAGE SCALING SYSTEM FOR OUT OF CONTEXT FUNCTIONAL SAFET...

ON CHIP POWER ON RESET WITH INTEGRATED SUPERVISORY FUNCTIONS FOR A...

PARALLEL MEMORY SELF-TESTING

ADAPTIVE VOLTAGE SCALING SYSTEM FOR OUT OF CONTEXT FUNCTIONAL SAFET...

ON CHIP POWER ON RESET WITH INTEGRATED SUPERVISORY FUNCTIONS FOR A...

ON CHIP REDUNDANT SYSTEM RESET FOR OUT OF CONTEXT FUNCTIONAL SAFETY...

Centralized Built-In Soft-Repair Architecture for Integrated Circui...

PACKET BASED INTEGRATED CIRCUIT TESTING

Clock Control of Pipelined Memory for Improved Delay Fault Testing