Berkeley, CA, US
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Patent Grant
The Regents of the University of California
Christopher J. Chang
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
Sumin Lee
G01 - MEASURING TESTING
Information
Patent Grant
The Regents of the University of California
Christopher J. Chang
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
The Regents of the University of California
Christopher J. Chang
G01 - MEASURING TESTING
Information
Patent Application
The Regents of the University of California
Sumin Lee
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
The Regents of the University of California
Christopher J. Chang
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
