Sumio Ogawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including antifuse element
- Patent number 8,179,709
- Issue date May 15, 2012
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including anti-fuse circuit, and method of wri...
- Patent number 7,952,950
- Issue date May 31, 2011
- Elpida Memory, Inc.
- Shinichi Miyatake
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a plurality of fuse elements and att...
- Patent number 7,868,417
- Issue date Jan 11, 2011
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Antifuse element and semiconductor device including same
- Patent number 7,755,163
- Issue date Jul 13, 2010
- Elpida Memory, Inc.
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 7,613,056
- Issue date Nov 3, 2009
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having fuse element arranged between electrode...
- Patent number 7,550,788
- Issue date Jun 23, 2009
- Elpida Memory, Inc.
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor storage device
- Patent number 7,417,908
- Issue date Aug 26, 2008
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip information managing method, chip information managing system,...
- Patent number 7,359,263
- Issue date Apr 15, 2008
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing semiconductor devices
- Patent number 7,054,705
- Issue date May 30, 2006
- NEC Electronics Corporation
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory production system and semiconductor memory pro...
- Patent number 6,532,182
- Issue date Mar 11, 2003
- NEC Corporation
- Sumio Ogawa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor device manufacturing system and method of manufacturi...
- Patent number 6,349,240
- Issue date Feb 19, 2002
- NEC Corporation
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory test circuit
- Patent number 6,191,987
- Issue date Feb 20, 2001
- NEC Corporation
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device incorporating redundancy memory cells
- Patent number 5,570,318
- Issue date Oct 29, 1996
- NEC Corporation
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory device equipped with dummy cells imple...
- Patent number 5,485,427
- Issue date Jan 16, 1996
- NEC Corporation
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory device equipped with dummy cells imple...
- Patent number 5,371,707
- Issue date Dec 6, 1994
- NEC Corporation
- Sumio Ogawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING ANTIFUSE ELEMENT
- Publication number 20120199943
- Publication date Aug 9, 2012
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device including anti-fuse circuit, and method of wri...
- Publication number 20090109790
- Publication date Apr 30, 2009
- Elpida Memory, Inc.
- Shinichi Miyatake
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING ANTIFUSE ELEMENT
- Publication number 20090052221
- Publication date Feb 26, 2009
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Application
Antifuse element and semiconductor device including same
- Publication number 20090026577
- Publication date Jan 29, 2009
- Elpida Memory, Inc.
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20080279020
- Publication date Nov 13, 2008
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device having a fuse element
- Publication number 20080179707
- Publication date Jul 31, 2008
- Elpida Memory, Inc.
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of disconnecting fuse element
- Publication number 20080179708
- Publication date Jul 31, 2008
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device having fuse element and method of cutting fuse...
- Publication number 20070235837
- Publication date Oct 11, 2007
- Elpida Memory, Inc.
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having fuse element and method of cutting fuse...
- Publication number 20070176256
- Publication date Aug 2, 2007
- Elpida Memory, Inc.
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chip information managing method, chip information managing system,...
- Publication number 20060268634
- Publication date Nov 30, 2006
- ELPIDA MEMORY, INC.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor storage device
- Publication number 20060227588
- Publication date Oct 12, 2006
- Elpida Memory, Inc.
- Sumio Ogawa
- G11 - INFORMATION STORAGE
Information Patent Application
Method of manufacturing semiconductor devices
- Publication number 20020059012
- Publication date May 16, 2002
- NEC Corporation
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Failure analyzing device for semiconductors
- Publication number 20020059010
- Publication date May 16, 2002
- NEC Corporation
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing system and method of manufacturi...
- Publication number 20010026949
- Publication date Oct 4, 2001
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory production system and semiconductor memory pro...
- Publication number 20010026486
- Publication date Oct 4, 2001
- NEC Corporation
- Sumio Ogawa
- H01 - BASIC ELECTRIC ELEMENTS

Sumio Ogawa

Person

Patents Grantslast 30 patents

Semiconductor device including antifuse element

Semiconductor device including anti-fuse circuit, and method of wri...

Semiconductor device including a plurality of fuse elements and att...

Antifuse element and semiconductor device including same

Semiconductor memory device

Semiconductor device having fuse element arranged between electrode...

Semiconductor storage device

Chip information managing method, chip information managing system,...

Method of manufacturing semiconductor devices

Semiconductor memory production system and semiconductor memory pro...

Semiconductor device manufacturing system and method of manufacturi...

Semiconductor memory test circuit

Semiconductor memory device incorporating redundancy memory cells

Dynamic random access memory device equipped with dummy cells imple...

Dynamic random access memory device equipped with dummy cells imple...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE INCLUDING ANTIFUSE ELEMENT

Semiconductor device including anti-fuse circuit, and method of wri...

SEMICONDUCTOR DEVICE INCLUDING ANTIFUSE ELEMENT

Antifuse element and semiconductor device including same

SEMICONDUCTOR MEMORY DEVICE

Semiconductor device having a fuse element

Semiconductor device and method of disconnecting fuse element

Semiconductor device having fuse element and method of cutting fuse...

Semiconductor device having fuse element and method of cutting fuse...

Chip information managing method, chip information managing system,...

Semiconductor storage device

Method of manufacturing semiconductor devices

Failure analyzing device for semiconductors

Semiconductor device manufacturing system and method of manufacturi...

Semiconductor memory production system and semiconductor memory pro...