Sumio SASAKI

Follow

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring energy spectrum of backscattered...
- Patent number 11,322,332
- Issue date May 3, 2022
- TASMIT, INC.
- Makoto Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary particle detection system of scanning electron microscope
- Patent number 10,515,778
- Issue date Dec 24, 2019
- NGR Inc.
- Sumio Sasaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING ENERGY SPECTRUM OF BACKSCATTERED...
- Publication number 20210012999
- Publication date Jan 14, 2021
- TASMIT, INC.
- Makoto KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING DEFECT OF CONTACT HOLE
- Publication number 20180330494
- Publication date Nov 15, 2018
- NGR Inc.
- Kazuto TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECONDARY PARTICLE DETECTION SYSTEM OF SCANNING ELECTRON MICROSCOPE
- Publication number 20170271124
- Publication date Sep 21, 2017
- NGR Inc.
- Sumio SASAKI
- H01 - BASIC ELECTRIC ELEMENTS