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Sumio Shimonishi
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor wafer test system
Patent number
10,845,383
Issue date
Nov 24, 2020
Keysight Technologies, Inc.
Kenichi Takano
G01 - MEASURING TESTING
Information
Patent Grant
Light-emitting device and method of making same
Patent number
7,569,867
Issue date
Aug 4, 2009
Avago Technologies ECBU IP (Singapore) Pte Ltd
Sumio Shimonishi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR WAFER TEST SYSTEM
Publication number
20200132720
Publication date
Apr 30, 2020
KEYSIGHT TECHNOLOGIES, INC.
Kenichi Takano
G01 - MEASURING TESTING
Information
Patent Application
Light-emitting device and method of making same
Publication number
20060114678
Publication date
Jun 1, 2006
AGILENT TECHNOLOGIES, INC.
Sumio Shimonishi
G02 - OPTICS