Sumit DasGupta

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Complete chip I/O test through low contact testing using enhanced b...
- Patent number 5,787,098
- Issue date Jul 28, 1998
- International Business Machines Corporation
- Sumit DasGupta
- G01 - MEASURING TESTING
Information Patent Grant
Interrupt mechanism for multiprocessing system having a plurality o...
- Patent number 4,736,319
- Issue date Apr 5, 1988
- International Business Machines Corp.
- Sumit DasGupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of concurrently testing each of a plurality of interconnecte...
- Patent number 4,509,008
- Issue date Apr 2, 1985
- International Business Machines Corporation
- Sumit DasGupta
- G01 - MEASURING TESTING
Information Patent Grant
Chip partitioning aid (CPA)-A structure for test pattern generation...
- Patent number 4,503,386
- Issue date Mar 5, 1985
- International Business Machines Corporation
- Sumit DasGupta
- G01 - MEASURING TESTING
Information Patent Grant
High speed binary counter
- Patent number 4,408,336
- Issue date Oct 4, 1983
- International Business Machines Corp.
- Sumit DasGupta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Level sensitive scan design (LSSD) system
- Patent number 4,293,919
- Issue date Oct 6, 1981
- International Business Machines Corporation
- Sumit Dasgupta
- G01 - MEASURING TESTING