Sun Ya Lei

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Method for probing impact sensitive and thin layered substrate
- Patent number 7,362,116
- Issue date Apr 22, 2008
- Electroglas, Inc.
- Uday Nayak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PROBING IMPACT SENSITVE AND THIN LAYERED SUBSTRATE
- Publication number 20080150559
- Publication date Jun 26, 2008
- Uday Nayak
- G01 - MEASURING TESTING