Sundar Jawaharlal

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Glen Allen, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inline defect analysis for sampling and SPC
- Patent number 8,799,831
- Issue date Aug 5, 2014
- Applied Materials, Inc.
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Grant
Stage yield prediction
- Patent number 7,962,864
- Issue date Jun 14, 2011
- Applied Materials, Inc.
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic inline yield analysis and prediction of a defect limited yi...
- Patent number 7,937,179
- Issue date May 3, 2011
- Applied Materials, Inc.
- Rinat Shimshi
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Stage yield prediction
- Publication number 20080295047
- Publication date Nov 27, 2008
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inline defect analysis for sampling and SPC
- Publication number 20080295048
- Publication date Nov 27, 2008
- Youval Nehmadi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining factors for design considerati...
- Publication number 20080295063
- Publication date Nov 27, 2008
- Vicky Svidenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic inline yield analysis and prediction
- Publication number 20080294281
- Publication date Nov 27, 2008
- Rinat Shimshi
- G06 - COMPUTING CALCULATING COUNTING